81
TITLE: Energy-dependent relaxation time in quaternary amorphous oxide semiconductors probed by gated Hall effect measurements
AUTHORS: Socratous, J; Watanabe, S; Banger, KK; Warwick, CN; Branquinho, R; Barquinha, P; Martins, R; Fortunato, E; Sirringhaus, H;
PUBLISHED: 2017, SOURCE: PHYSICAL REVIEW B, VOLUME: 95, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef: 10
IN MY: ORCID
82
TITLE: Solution based zinc tin oxide TFTs: the dual role of the organic solvent  Full Text
AUTHORS: Salgueiro, D; Kiazadeh, A; Branquinho, R; Santos, L; Barquinha, P; Martins, R; Fortunato, E;
PUBLISHED: 2017, SOURCE: JOURNAL OF PHYSICS D-APPLIED PHYSICS, VOLUME: 50, ISSUE: 6
INDEXED IN: Scopus WOS CrossRef: 29
IN MY: ORCID
83
TITLE: Photocatalytic TiO2 Nanorod Spheres and Arrays Compatible with Flexible Applications  Full Text
AUTHORS: Nunes, D; Pimentel, A; Santos, L; Barquinha, P; Fortunato, E; Martins, R;
PUBLISHED: 2017, SOURCE: CATALYSTS, VOLUME: 7, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef: 56
IN MY: ORCID
84
TITLE: A Low-Power Analog Adder and Driver Using a-IGZO TFTs
AUTHORS: Bahubalindruni, PG ; Tavares, VG ; Martins, R; Fortunato, E; Barquinha, P;
PUBLISHED: 2017, SOURCE: IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, VOLUME: 64, ISSUE: 5
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
85
TITLE: Boosting Electrical Performance of High-kappa Nanomultilayer Dielectrics and Electronic Devices by Combining Solution Combustion Synthesis and UV Irradiation
AUTHORS: Carlos, E; Branquinho, R; Kiazadeh, A; Martins, J; Barquinha, P; Martins, R; Fortunato, E;
PUBLISHED: 2017, SOURCE: ACS APPLIED MATERIALS & INTERFACES, VOLUME: 9, ISSUE: 46
INDEXED IN: Scopus WOS CrossRef: 54
IN MY: ORCID
86
TITLE: Threshold voltage extraction techniques adaptable from sub-micron CMOS to large-area oxide TFT technologies
AUTHORS: Samanta, S; Tiwari, B; Bahubalindruni, PG ; Barquinha, P; Goes, J;
PUBLISHED: 2017, SOURCE: INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS, VOLUME: 45, ISSUE: 12
INDEXED IN: Scopus WOS CrossRef: 7
IN MY: ORCID
87
TITLE: Bias stress and temperature impact on InGaZnO TFTs and circuits  Full Text
AUTHORS: Jorge Martins; Pydi Bahubalindruni; Ana Rovisco; Asal Kiazadeh; Rodrigo Martins; Elvira Fortunato; Pedro Barquinha;
PUBLISHED: 2017, SOURCE: Materials, VOLUME: 10, ISSUE: 6
INDEXED IN: Scopus CrossRef: 23
IN MY: ORCID
88
TITLE: Charging effects and surface potential variations of Cu-based nanowires  Full Text
AUTHORS: Nunes, D; Calmeiro, TR; Nandy, S; Pinto, JV; Pimentel, A; Barquinha, P; Carvalho, PA; Walmsley, JC; Fortunato, E; Martins, R;
PUBLISHED: 2016, SOURCE: THIN SOLID FILMS, VOLUME: 601
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
89
TITLE: A thermalization energy analysis of the threshold voltage shift in amorphous indium gallium zinc oxide thin film transistors under positive gate bias stress  Full Text
AUTHORS: Niang, KM; Barquinha, PMC; Martins, RFP; Cobb, B; Powell, MJ; Flewitt, AJ;
PUBLISHED: 2016, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 108, ISSUE: 9
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
90
TITLE: InGaZnO TFT behavioral model for IC design  Full Text
AUTHORS: Pydi Bahubalindrun ; Vitor Tavares ; Pedro Barquinha; Pedro Guedes de Oliveira; Rodrigo Martins; Elvira Fortunato;
PUBLISHED: 2016, SOURCE: ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, VOLUME: 87, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef: 14
IN MY: ORCID
Page 9 of 17. Total results: 167.