Mário Manuel Silveira Rodrigues
AuthID: R-000-JYA
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TITLE: Integration of an Atomic Force Microscope in a Beamline Sample Environment Full Text
AUTHORS: Rodrigues, MS; Hrouzek, M; Dhez, O; Chevrier, J; Comin, F; Garrett, R; Gentle, I; Nugent, K; Wilkins, S;
PUBLISHED: 2010, SOURCE: 10th International Conference on Synchrotron Radiation Instrumentation in SRI 2009: THE 10TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION, VOLUME: 1234
AUTHORS: Rodrigues, MS; Hrouzek, M; Dhez, O; Chevrier, J; Comin, F; Garrett, R; Gentle, I; Nugent, K; Wilkins, S;
PUBLISHED: 2010, SOURCE: 10th International Conference on Synchrotron Radiation Instrumentation in SRI 2009: THE 10TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION, VOLUME: 1234
32
TITLE: From ensemble average to single (nano-) objects properties by X-ray microdiffraction: a short review on structure determination (local strain, composition, ... ) and objects manipulation (AFM-coupled)
AUTHORS: Mocuta, C; Mundboth, K; Stangl, J; Krause, B; Malachias, A; Th. Scheller; Cornelius, T; Paniago, R; Diaz, A; Rodrigues, M; Chevrier, J; Dhez, O; Metzger, TH; Bauer, G; Barbier, A; Ramos, AV; J Guittet; B Moussy; Stanescu, S; Mattana, R; ...More
PUBLISHED: 2010, SOURCE: REVUE DE METALLURGIE-CAHIERS D INFORMATIONS TECHNIQUES, VOLUME: 107, ISSUE: 10-11
AUTHORS: Mocuta, C; Mundboth, K; Stangl, J; Krause, B; Malachias, A; Th. Scheller; Cornelius, T; Paniago, R; Diaz, A; Rodrigues, M; Chevrier, J; Dhez, O; Metzger, TH; Bauer, G; Barbier, A; Ramos, AV; J Guittet; B Moussy; Stanescu, S; Mattana, R; ...More
PUBLISHED: 2010, SOURCE: REVUE DE METALLURGIE-CAHIERS D INFORMATIONS TECHNIQUES, VOLUME: 107, ISSUE: 10-11
33
TITLE: Probing the elastic properties of individual nanostructures by combining in situ atomic force microscopy and micro-x-ray diffraction Full Text
AUTHORS: Scheler, T; Rodrigues, M; Cornelius, TW; Mocuta, C; Malachias, A; Magalhaes Paniago, R; Comin, F; Chevrier, J; Metzger, TH;
PUBLISHED: 2009, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 94, ISSUE: 2
AUTHORS: Scheler, T; Rodrigues, M; Cornelius, TW; Mocuta, C; Malachias, A; Magalhaes Paniago, R; Comin, F; Chevrier, J; Metzger, TH;
PUBLISHED: 2009, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 94, ISSUE: 2
34
TITLE: In situ observation of the elastic deformation of a single epitaxial SiGe crystal by combining atomic force microscopy and micro x-ray diffraction Full Text
AUTHORS: Rodrigues, MS; Cornelius, TW; Scheler, T; Mocuta, C; Malachias, A; Magalhaes Paniago, R; Dhez, O; Comin, F; Metzger, TH; Chevrier, J;
PUBLISHED: 2009, SOURCE: JOURNAL OF APPLIED PHYSICS, VOLUME: 106, ISSUE: 10
AUTHORS: Rodrigues, MS; Cornelius, TW; Scheler, T; Mocuta, C; Malachias, A; Magalhaes Paniago, R; Dhez, O; Comin, F; Metzger, TH; Chevrier, J;
PUBLISHED: 2009, SOURCE: JOURNAL OF APPLIED PHYSICS, VOLUME: 106, ISSUE: 10
35
TITLE: X-ray pushing of a mechanical microswing Full Text
AUTHORS: Siria, A; Rodrigues, MS; Dhez, O; Schwartz, W; Torricelli, G; LeDenmat, S; Rochat, N; Auvert, G; Bikondoa, O; Metzger, TH; Wermeille, D; Felici, R; Comin, F; Chevrier, J;
PUBLISHED: 2008, SOURCE: NANOTECHNOLOGY, VOLUME: 19, ISSUE: 44
AUTHORS: Siria, A; Rodrigues, MS; Dhez, O; Schwartz, W; Torricelli, G; LeDenmat, S; Rochat, N; Auvert, G; Bikondoa, O; Metzger, TH; Wermeille, D; Felici, R; Comin, F; Chevrier, J;
PUBLISHED: 2008, SOURCE: NANOTECHNOLOGY, VOLUME: 19, ISSUE: 44
36
TITLE: Local detection of X-ray spectroscopies with an in-situ Atomic Force Microscope
AUTHORS: Rodrigues, MS; Dhez, O; Le Denmat, S; Chevrier, J; Felici, R; Comin, F;
PUBLISHED: 2008, SOURCE: JOURNAL OF INSTRUMENTATION, VOLUME: 3, ISSUE: 12
AUTHORS: Rodrigues, MS; Dhez, O; Le Denmat, S; Chevrier, J; Felici, R; Comin, F;
PUBLISHED: 2008, SOURCE: JOURNAL OF INSTRUMENTATION, VOLUME: 3, ISSUE: 12
