Luis Alexandre Machado da Rocha
AuthID: R-000-M11
91
TITLE: Pull-in dynamics: Analysis and modeling of the transitional regime
AUTHORS: Rocha, LA; Cretu, E; Wolffenbuttel, AF;
PUBLISHED: 2004, SOURCE: 17th IEEE International Conference on Micro Electro Mechanical Systems in MEMS 2004: 17TH IEEE INTERNATIONAL CONFERENCE ON MICRO ELECTRO MECHANICAL SYSTEMS, TECHNICAL DIGEST
AUTHORS: Rocha, LA; Cretu, E; Wolffenbuttel, AF;
PUBLISHED: 2004, SOURCE: 17th IEEE International Conference on Micro Electro Mechanical Systems in MEMS 2004: 17TH IEEE INTERNATIONAL CONFERENCE ON MICRO ELECTRO MECHANICAL SYSTEMS, TECHNICAL DIGEST
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ResearcherID92
TITLE: Analytical model for the pull-in time of low-Q MEMS devices
AUTHORS: Rocha, LA; Cretu, E; Wolffenbuttel, RF;
PUBLISHED: 2004, SOURCE: Nanotechnology Conference and Trade Show (Nanotech 2004) in NSTI NANOTECH 2004, VOL 2, TECHNICAL PROCEEDINGS
AUTHORS: Rocha, LA; Cretu, E; Wolffenbuttel, RF;
PUBLISHED: 2004, SOURCE: Nanotechnology Conference and Trade Show (Nanotech 2004) in NSTI NANOTECH 2004, VOL 2, TECHNICAL PROCEEDINGS
INDEXED IN: WOS
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ResearcherID93
TITLE: Stability of a micromechanical pull-in voltage reference
AUTHORS: Rocha, LA; Cretu, E; Wolffenbuttel, RF;
PUBLISHED: 2003, SOURCE: Conference on Precision Electromagnetic Measurements (CPEM 2002) in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 52, ISSUE: 2
AUTHORS: Rocha, LA; Cretu, E; Wolffenbuttel, RF;
PUBLISHED: 2003, SOURCE: Conference on Precision Electromagnetic Measurements (CPEM 2002) in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 52, ISSUE: 2
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ORCID | ResearcherID
ORCID | ResearcherID94
TITLE: Performance of integrated silicon infrared microspectrometers
AUTHORS: Kong, SH; de Graaf, G; Roche, LA; Wolffenbuttel, RF;
PUBLISHED: 2003, SOURCE: 20th IEEE Instrumentation and Measurement Technology Conference in IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2
AUTHORS: Kong, SH; de Graaf, G; Roche, LA; Wolffenbuttel, RF;
PUBLISHED: 2003, SOURCE: 20th IEEE Instrumentation and Measurement Technology Conference in IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2
INDEXED IN: WOS
WOS IN MY: ResearcherID
ResearcherID95
TITLE: Micromechanical voltage reference using the pull-in of a beam
AUTHORS: Cretu, E; Rocha, LA; Wolffenbuttel, RF;
PUBLISHED: 2001, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 50, ISSUE: 6
AUTHORS: Cretu, E; Rocha, LA; Wolffenbuttel, RF;
PUBLISHED: 2001, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 50, ISSUE: 6
IN MY: ORCID | ResearcherID
ORCID | ResearcherID