Luis Alexandre Machado da Rocha
AuthID: R-000-M11
91
TITLE: Testing the dependability and performance of group communication based database replication protocols
AUTHORS: Sousa, A ; Pereira, J ; Soares, L; Correia, A; Rocha, L; Oliveira, R ; Moura, F ;
PUBLISHED: 2005, SOURCE: International Conference on Dependable Systems and Networks in 2005 INTERNATIONAL CONFERENCE ON DEPENDABLE SYSTEMS AND NETWORKS, PROCEEDINGS
AUTHORS: Sousa, A ; Pereira, J ; Soares, L; Correia, A; Rocha, L; Oliveira, R ; Moura, F ;
PUBLISHED: 2005, SOURCE: International Conference on Dependable Systems and Networks in 2005 INTERNATIONAL CONFERENCE ON DEPENDABLE SYSTEMS AND NETWORKS, PROCEEDINGS
92
TITLE: A full-system dynamic model for complex MEMS structures
AUTHORS: Rocha, LA; Cretu, E; Wolffenbuttel, RF;
PUBLISHED: 2004, SOURCE: Nanotechnology Conference and Trade Show (Nanotech 2004) in NSTI NANOTECH 2004, VOL 2, TECHNICAL PROCEEDINGS
AUTHORS: Rocha, LA; Cretu, E; Wolffenbuttel, RF;
PUBLISHED: 2004, SOURCE: Nanotechnology Conference and Trade Show (Nanotech 2004) in NSTI NANOTECH 2004, VOL 2, TECHNICAL PROCEEDINGS
INDEXED IN: WOS
IN MY: ResearcherID
93
TITLE: Pull-in dynamics: Analysis and modeling of the transitional regime
AUTHORS: Rocha, LA; Cretu, E; Wolffenbuttel, AF;
PUBLISHED: 2004, SOURCE: 17th IEEE International Conference on Micro Electro Mechanical Systems in MEMS 2004: 17TH IEEE INTERNATIONAL CONFERENCE ON MICRO ELECTRO MECHANICAL SYSTEMS, TECHNICAL DIGEST
AUTHORS: Rocha, LA; Cretu, E; Wolffenbuttel, AF;
PUBLISHED: 2004, SOURCE: 17th IEEE International Conference on Micro Electro Mechanical Systems in MEMS 2004: 17TH IEEE INTERNATIONAL CONFERENCE ON MICRO ELECTRO MECHANICAL SYSTEMS, TECHNICAL DIGEST
INDEXED IN: WOS
IN MY: ResearcherID
94
TITLE: Analytical model for the pull-in time of low-Q MEMS devices
AUTHORS: Rocha, LA; Cretu, E; Wolffenbuttel, RF;
PUBLISHED: 2004, SOURCE: Nanotechnology Conference and Trade Show (Nanotech 2004) in NSTI NANOTECH 2004, VOL 2, TECHNICAL PROCEEDINGS
AUTHORS: Rocha, LA; Cretu, E; Wolffenbuttel, RF;
PUBLISHED: 2004, SOURCE: Nanotechnology Conference and Trade Show (Nanotech 2004) in NSTI NANOTECH 2004, VOL 2, TECHNICAL PROCEEDINGS
INDEXED IN: WOS
IN MY: ResearcherID
95
TITLE: Stability of a micromechanical pull-in voltage reference
AUTHORS: Rocha, LA; Cretu, E; Wolffenbuttel, RF;
PUBLISHED: 2003, SOURCE: Conference on Precision Electromagnetic Measurements (CPEM 2002) in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 52, ISSUE: 2
AUTHORS: Rocha, LA; Cretu, E; Wolffenbuttel, RF;
PUBLISHED: 2003, SOURCE: Conference on Precision Electromagnetic Measurements (CPEM 2002) in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 52, ISSUE: 2
IN MY: ORCID | ResearcherID
96
TITLE: Performance of integrated silicon infrared microspectrometers
AUTHORS: Kong, SH; de Graaf, G; Roche, LA; Wolffenbuttel, RF;
PUBLISHED: 2003, SOURCE: 20th IEEE Instrumentation and Measurement Technology Conference in IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2
AUTHORS: Kong, SH; de Graaf, G; Roche, LA; Wolffenbuttel, RF;
PUBLISHED: 2003, SOURCE: 20th IEEE Instrumentation and Measurement Technology Conference in IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2
INDEXED IN: WOS
IN MY: ResearcherID
97
TITLE: Micromechanical voltage reference using the pull-in of a beam
AUTHORS: Cretu, E; Rocha, LA; Wolffenbuttel, RF;
PUBLISHED: 2001, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 50, ISSUE: 6
AUTHORS: Cretu, E; Rocha, LA; Wolffenbuttel, RF;
PUBLISHED: 2001, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 50, ISSUE: 6
IN MY: ORCID | ResearcherID