Radheshyam Rai
AuthID: R-000-NEM
121
TITLE: Structural and dielectric properties of Bi modified PLZT ceramics Full Text
AUTHORS: Rai, R; Sharma, S; Choudhary, RNP;
PUBLISHED: 2005, SOURCE: Solid State Communications, VOLUME: 133, ISSUE: 10
AUTHORS: Rai, R; Sharma, S; Choudhary, RNP;
PUBLISHED: 2005, SOURCE: Solid State Communications, VOLUME: 133, ISSUE: 10
122
TITLE: Dielectric and piezoelectric studies of Fe doped PLZT ceramics Full Text
AUTHORS: Rai, R; Sharma, S; Choudhary, RNP;
PUBLISHED: 2005, SOURCE: Materials Letters, VOLUME: 59, ISSUE: 29-30
AUTHORS: Rai, R; Sharma, S; Choudhary, RNP;
PUBLISHED: 2005, SOURCE: Materials Letters, VOLUME: 59, ISSUE: 29-30
123
TITLE: Microstructure modified HfO<sub>2</sub> using Zr addition with Ta<sub>x</sub>C<sub>y</sub> gate for improved device performance and reliability
AUTHORS: Hegde, RI; Triyoso, DH; Tobin, PJ; Kalpat, S; Ramon, ME; Tseng, HH; Schaeffer, JK; Luckowski, E; Taylor, WJ; Capasso, CC; Gilmer, DC; Moosa, M; Haggag, A; Raymond, M; Roan, D; Nguyen, J; La, LB; Hebert, E; Cotton, R; Wang, XD; ...More
PUBLISHED: 2005, SOURCE: IEEE INTERNATIONAL ELECTRON DEVICES MEETING 2005, TECHNICAL DIGEST
AUTHORS: Hegde, RI; Triyoso, DH; Tobin, PJ; Kalpat, S; Ramon, ME; Tseng, HH; Schaeffer, JK; Luckowski, E; Taylor, WJ; Capasso, CC; Gilmer, DC; Moosa, M; Haggag, A; Raymond, M; Roan, D; Nguyen, J; La, LB; Hebert, E; Cotton, R; Wang, XD; ...More
PUBLISHED: 2005, SOURCE: IEEE INTERNATIONAL ELECTRON DEVICES MEETING 2005, TECHNICAL DIGEST
INDEXED IN: 
WOS
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ORCID
ORCID124
TITLE: Regulating crown and flatness during hot rolling: A multiobjective optimization study using genetic algorithms
AUTHORS: Nandan, R; Rai, R; Jayakanth, R; Moitra, S; Chakraborti, N; Mukhopadhyay, A;
PUBLISHED: 2005, SOURCE: MATERIALS AND MANUFACTURING PROCESSES, VOLUME: 20, ISSUE: 3
AUTHORS: Nandan, R; Rai, R; Jayakanth, R; Moitra, S; Chakraborti, N; Mukhopadhyay, A;
PUBLISHED: 2005, SOURCE: MATERIALS AND MANUFACTURING PROCESSES, VOLUME: 20, ISSUE: 3
125
TITLE: Urethrovasocutaneous fistula in a case of anterior urethral stricture
AUTHORS: Singh, SK; Rai, RS; Sharma, SK;
PUBLISHED: 2005, SOURCE: UROLOGIA INTERNATIONALIS, VOLUME: 74, ISSUE: 1
AUTHORS: Singh, SK; Rai, RS; Sharma, SK;
PUBLISHED: 2005, SOURCE: UROLOGIA INTERNATIONALIS, VOLUME: 74, ISSUE: 1
126
TITLE: Fluoroalkylated polysilane film as a chemosensor for explosive nitroaromatic compounds
AUTHORS: Saxena, A; Fujiki, M; Rai, R; Kwak, G;
PUBLISHED: 2005, SOURCE: CHEMISTRY OF MATERIALS, VOLUME: 17, ISSUE: 8
AUTHORS: Saxena, A; Fujiki, M; Rai, R; Kwak, G;
PUBLISHED: 2005, SOURCE: CHEMISTRY OF MATERIALS, VOLUME: 17, ISSUE: 8
127
TITLE: Structural and dielectric properties of (La, Bi) modified PZT ceramics Full Text
AUTHORS: Rai, R; Sharma, S;
PUBLISHED: 2004, SOURCE: Solid State Communications, VOLUME: 129, ISSUE: 5
AUTHORS: Rai, R; Sharma, S;
PUBLISHED: 2004, SOURCE: Solid State Communications, VOLUME: 129, ISSUE: 5
128
TITLE: Structural and dielectric properties of Sb-doped PLZT ceramics Full Text
AUTHORS: Rai, R; Sharma, S;
PUBLISHED: 2004, SOURCE: 3rd Asian Meeting on Electroceramics in Ceramics International, VOLUME: 30, ISSUE: 7
AUTHORS: Rai, R; Sharma, S;
PUBLISHED: 2004, SOURCE: 3rd Asian Meeting on Electroceramics in Ceramics International, VOLUME: 30, ISSUE: 7
129
TITLE: Phase transition in Pb based tellurite ceramics
AUTHORS: Rai, R; Singh, MP; Singh, NK;
PUBLISHED: 2004, SOURCE: Indian Journal of Pure and Applied Physics, VOLUME: 42, ISSUE: 2
AUTHORS: Rai, R; Singh, MP; Singh, NK;
PUBLISHED: 2004, SOURCE: Indian Journal of Pure and Applied Physics, VOLUME: 42, ISSUE: 2
INDEXED IN: 
Scopus
Scopus IN MY: ORCID
ORCID130
TITLE: Fermi-level pinning at the polysilicon/metal oxide interface - Part I
AUTHORS: Hobbs, CC; Fonseca, LRC; Knizhnik, A; Dhandapani, V; Samavedam, SB; Taylor, WJ; Grant, JM; Dip, LG; Triyoso, DH; Hegde, RI; Gilmer, DC; Garcia, R; Roan, D; Lovejoy, ML; Rai, RS; Hebert, EA; Tseng, HH; Anderson, SGH; White, BE; Tobin, PJ;
PUBLISHED: 2004, SOURCE: IEEE TRANSACTIONS ON ELECTRON DEVICES, VOLUME: 51, ISSUE: 6
AUTHORS: Hobbs, CC; Fonseca, LRC; Knizhnik, A; Dhandapani, V; Samavedam, SB; Taylor, WJ; Grant, JM; Dip, LG; Triyoso, DH; Hegde, RI; Gilmer, DC; Garcia, R; Roan, D; Lovejoy, ML; Rai, RS; Hebert, EA; Tseng, HH; Anderson, SGH; White, BE; Tobin, PJ;
PUBLISHED: 2004, SOURCE: IEEE TRANSACTIONS ON ELECTRON DEVICES, VOLUME: 51, ISSUE: 6
