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TITLE: Development of a reference database for Ion Beam Analysis and future perspectives  Full Text
AUTHORS: Abriola, D; Barradas, NP ; Bogdanovic Radovic, I; Chiari, M; Gurbich, AF; Jeynes, C; Kokkoris, M; Mayer, M; Ramos, AR ; Shi, L; Vickridge, I;
PUBLISHED: 2011, SOURCE: 10th European Conference on Accelerators in Applied Research and Technology (ECAART) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 269, ISSUE: 24
INDEXED IN: Scopus WOS CrossRef
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TITLE: Thin film depth profiling using simultaneous particle backscattering and nuclear resonance profiling  Full Text
AUTHORS: Barradas, NP ; Mateus, R ; Fonseca, M. ; Miguel A. Reis ; Lorenz, K ; Vickridge, I;
PUBLISHED: 2010, SOURCE: 19th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 268, ISSUE: 11-12
INDEXED IN: Scopus WOS CrossRef