António Manuel Cruz Serra
AuthID: R-000-28E
31
TITLE: Nonlinearities, the generators perspective in ADC statistical testing techniques
AUTHORS: Martins, RC; Serra, AC;
PUBLISHED: 2001, SOURCE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
AUTHORS: Martins, RC; Serra, AC;
PUBLISHED: 2001, SOURCE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
INDEXED IN: 
Scopus
Scopus IN MY: 
ORCID
ORCID32
TITLE: Uncertainty in the ADC transition voltages determined with the histogram method
AUTHORS: Corrêa Alegria, F; Cruz Serra, A;
PUBLISHED: 2001, SOURCE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
AUTHORS: Corrêa Alegria, F; Cruz Serra, A;
PUBLISHED: 2001, SOURCE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
INDEXED IN: Scopus
Scopus IN MY: ORCID
ORCID33
TITLE: Improving convergence of sine fitting algorithms
AUTHORS: Fonseca Da Silva, M; Cruz Serra, A;
PUBLISHED: 2001, SOURCE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
AUTHORS: Fonseca Da Silva, M; Cruz Serra, A;
PUBLISHED: 2001, SOURCE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
INDEXED IN: Scopus
Scopus IN MY: ORCID
ORCID34
TITLE: ADC testing based on IEEE 1057-94 Standard - some critical notes
AUTHORS: Pasquale Arpaia; Antonio Cruz Serra; Pasquale Daponte; Conceicao Libano Monteiro;
PUBLISHED: 2000, SOURCE: IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control' in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 1
AUTHORS: Pasquale Arpaia; Antonio Cruz Serra; Pasquale Daponte; Conceicao Libano Monteiro;
PUBLISHED: 2000, SOURCE: IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control' in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 1
INDEXED IN: Scopus
Scopus IN MY: ORCID
ORCID35
TITLE: ADC characterization by using the histogram test stimulated by Gaussian noise Full Text
AUTHORS: Raul Carneiro Martins; António Cruz Serra;
PUBLISHED: 2000, SOURCE: Measurement, VOLUME: 27, ISSUE: 4
AUTHORS: Raul Carneiro Martins; António Cruz Serra;
PUBLISHED: 2000, SOURCE: Measurement, VOLUME: 27, ISSUE: 4
36
TITLE: Logic Analyzers
AUTHORS: Pedro M B Silva Gir��o; Ant��nio M Cruz Serra; Helena M Geirinhas Ramos ;
PUBLISHED: 1999, SOURCE: Wiley Encyclopedia of Electrical and Electronics Engineering
AUTHORS: Pedro M B Silva Gir��o; Ant��nio M Cruz Serra; Helena M Geirinhas Ramos ;
PUBLISHED: 1999, SOURCE: Wiley Encyclopedia of Electrical and Electronics Engineering
INDEXED IN: 
CrossRef
CrossRef37
TITLE: Volt-Ampere Meters
AUTHORS: Pedro M B Silva Gir��o; Ant��nio M Cruz Serra; Helena M Geirinhas Ramos ;
PUBLISHED: 1999, SOURCE: Wiley Encyclopedia of Electrical and Electronics Engineering
AUTHORS: Pedro M B Silva Gir��o; Ant��nio M Cruz Serra; Helena M Geirinhas Ramos ;
PUBLISHED: 1999, SOURCE: Wiley Encyclopedia of Electrical and Electronics Engineering
INDEXED IN: CrossRef
CrossRef38
TITLE: Electric Distortion Measurement
AUTHORS: Pedro Silva B S Gir��o; Ant��nio Cruz C Serra; Helena Geirinhas G Ramos ;
PUBLISHED: 1999, SOURCE: Wiley Encyclopedia of Electrical and Electronics Engineering
AUTHORS: Pedro Silva B S Gir��o; Ant��nio Cruz C Serra; Helena Geirinhas G Ramos ;
PUBLISHED: 1999, SOURCE: Wiley Encyclopedia of Electrical and Electronics Engineering
INDEXED IN: CrossRef
CrossRef39
TITLE: Taxonomic problems on ADC characterization
AUTHORS: Carneiro C Martins; Geirinhas G Ramos ; Silva S Girao; Cruz C Serra;
PUBLISHED: 1998, SOURCE: Proceedings of the 1998 5th IEEE International Conference on Electronics, Circuits and Systems (ICECS'98) - Surfing the Waves of Science and Technology in Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems, VOLUME: 3
AUTHORS: Carneiro C Martins; Geirinhas G Ramos ; Silva S Girao; Cruz C Serra;
PUBLISHED: 1998, SOURCE: Proceedings of the 1998 5th IEEE International Conference on Electronics, Circuits and Systems (ICECS'98) - Surfing the Waves of Science and Technology in Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems, VOLUME: 3
INDEXED IN: Scopus
Scopus IN MY: ORCID
ORCID40
TITLE: Use of a noise stimulus in ADC characterization
AUTHORS: Carneiro C Martins; Cruz M C Serra;
PUBLISHED: 1998, SOURCE: Proceedings of the 1998 5th IEEE International Conference on Electronics, Circuits and Systems (ICECS'98) - Surfing the Waves of Science and Technology in Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems, VOLUME: 3
AUTHORS: Carneiro C Martins; Cruz M C Serra;
PUBLISHED: 1998, SOURCE: Proceedings of the 1998 5th IEEE International Conference on Electronics, Circuits and Systems (ICECS'98) - Surfing the Waves of Science and Technology in Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems, VOLUME: 3
INDEXED IN: Scopus
Scopus