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TITLE: On the electrical properties of ALD HfO2 dielectric films for MEMS capacitive switches  Full Text
AUTHORS: Theocharis, J; João Poças Martins; Mahjoub, A; Eustache, E; Ziaei, A; Papaioannou, G;
PUBLISHED: 2025, SOURCE: MICROELECTRONICS RELIABILITY, VOLUME: 169
INDEXED IN: WOS CrossRef
IN MY: ORCID
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TITLE: Do BIM aos Gémeos Digitais na Gestão de Ativos
AUTHORS: João Poças Martins;
PUBLISHED: 2025
INDEXED IN: Handle