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TITLE: Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron Diffraction  Full Text
AUTHORS: Daniel Carvalho; Knut Mueller Caspary; Marco Schowalter; Tim Grieb; Thorsten Mehrtens; Andreas Rosenauer; Teresa Ben; Rafael Garcia; Andres Redondo Cubero; Katharina Lorenz; Bruno Daudin; Francisco M Morales;
PUBLISHED: 2016, SOURCE: SCIENTIFIC REPORTS, VOLUME: 6
INDEXED IN: Scopus WOS CrossRef