91
TITLE: Sputter depth profiling by secondary ion mass spectrometry coupled with sample current measurements
AUTHORS: Bardi, U; Chenakin, SP; Lavacchi, A; Pagura, C; Tolstogouzov, A;
PUBLISHED: 2006, SOURCE: APPLIED SURFACE SCIENCE, VOLUME: 252, ISSUE: 20
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
92
TITLE: XPS and ToF-SIMS characterization of a Finemet surface: Effect of cooling  Full Text
AUTHORS: Chenakin, SP; Vasylyev, MA; Kruse, N; Tolstogouzov, AB;
PUBLISHED: 2006, SOURCE: Surface and Interface Analysis, VOLUME: 38, ISSUE: 7
INDEXED IN: Scopus CrossRef
IN MY: ORCID
93
TITLE: Surface modification of industrial alloys induced by long-term interaction with an ionic liquid
AUTHORS: Bardi, U; Chenakin, SP; Caporali, S; Lavacchi, A; Perissi, I; Tolstogouzov, A;
PUBLISHED: 2006, SOURCE: SURFACE AND INTERFACE ANALYSIS, VOLUME: 38, ISSUE: 12-13
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
94
TITLE: Study of high-temperature degradation of multilayer thin-film coatings based on chromium and aluminum nitrides
AUTHORS: Tolstogouzov, AB; Bardi, U; Chenakin, SP;
PUBLISHED: 2006, SOURCE: Bulletin of the Russian Academy of Sciences: Physics, VOLUME: 70, ISSUE: 8
INDEXED IN: Scopus
IN MY: ORCID
95
TITLE: Corrosion behavior of metals and alloys in ionic liquid, the 1-butyl-3-methyl-imidazolium bis-(trifluoromethanesulfonyl)-imide
AUTHORS: Perissi, I; Caporali, S; Bardi, U; Lavacchi, A; Tolstoguzov, A;
PUBLISHED: 2006, SOURCE: ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, VOLUME: 231
INDEXED IN: WOS
IN MY: ORCID
96
TITLE: XPS and ToF-SIMS characterization of a Finemet surface: effect of cooling
AUTHORS: Chenakin, SP; Vasylyev, MA; Kruse, N; Tolstogouzov, AB;
PUBLISHED: 2006, SOURCE: SURFACE AND INTERFACE ANALYSIS, VOLUME: 38, ISSUE: 7
INDEXED IN: WOS
IN MY: ORCID
97
TITLE: High-temperature oxidation of CrN/AlN multilayer coatings
AUTHORS: Bardi, U; Chenakin, SP; Ghezzi, F; Giolli, C; Goruppa, A; Lavacchi, A; Miorin, E; Pagura, C; Tolstogouzov, A;
PUBLISHED: 2005, SOURCE: APPLIED SURFACE SCIENCE, VOLUME: 252, ISSUE: 5
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
98
TITLE: Mass-resolved ion scattering spectrometry for characterization of samples with historical value
AUTHORS: Daolio, S; Pagura, C; Tolstogouzov, A;
PUBLISHED: 2004, SOURCE: APPLIED SURFACE SCIENCE, VOLUME: 222, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
99
TITLE: MARISS study on ion yields of Ne<SUP>+</SUP> scattered from III-V compound semiconductors
AUTHORS: Tolstogouzov, A; Daolio, S; Pagura, C;
PUBLISHED: 2004, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 217, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
100
TITLE: Dependence of Ne+ scattered ion yield on incident energy for surfaces of pure gallium and indium
AUTHORS: Tolstoguzov, AB; Daolio, S; Pagura, C;
PUBLISHED: 2004, SOURCE: Izvestiya Akademii Nauk. Ser. Fizicheskaya, VOLUME: 68, ISSUE: 3
INDEXED IN: Scopus
IN MY: ORCID
Page 10 of 14. Total results: 137.