Nebiha Ben Sedrine
AuthID: R-000-XEG
11
TITLE: Photoluminescence studies of a perceived white light emission from a monolithic InGaN/GaN quantum well structure Full Text
AUTHORS: Ben Sedrine, N; Esteves, TC; Rodrigues, J; Rino, L; Correia, MR; Sequeira, MC; Neves, AJ; Alves, E; Bockowski, M; Edwards, PR; O'Donnell, KP; Lorenz, K; Monteiro, T;
PUBLISHED: 2015, SOURCE: SCIENTIFIC REPORTS, VOLUME: 5
AUTHORS: Ben Sedrine, N; Esteves, TC; Rodrigues, J; Rino, L; Correia, MR; Sequeira, MC; Neves, AJ; Alves, E; Bockowski, M; Edwards, PR; O'Donnell, KP; Lorenz, K; Monteiro, T;
PUBLISHED: 2015, SOURCE: SCIENTIFIC REPORTS, VOLUME: 5
12
TITLE: Infrared dielectric functions and optical phonons of wurtzite YxAl1-xN (0 <= x <= 0.22) Full Text
AUTHORS: Ben Sedrine, N; Zukauskaite, A; Birch, J; Jensen, J; Hultman, L; Schoeche, S; Schubert, M; Darakchieva, V;
PUBLISHED: 2015, SOURCE: JOURNAL OF PHYSICS D-APPLIED PHYSICS, VOLUME: 48, ISSUE: 41
AUTHORS: Ben Sedrine, N; Zukauskaite, A; Birch, J; Jensen, J; Hultman, L; Schoeche, S; Schubert, M; Darakchieva, V;
PUBLISHED: 2015, SOURCE: JOURNAL OF PHYSICS D-APPLIED PHYSICS, VOLUME: 48, ISSUE: 41
13
TITLE: GaN:Pr3+ nanostructures for red solid state light emission
AUTHORS: Rodrigues, J; Ben Sedrine, N; Felizardo, M ; Soares, MJ; Alves, E; Neves, AJ; Fellmann, V; Tourbot, G; Auzelle, T; Daudin, B; Bockowski, M; Lorenz, K; Monteiro, T;
PUBLISHED: 2014, SOURCE: RSC ADVANCES, VOLUME: 4, ISSUE: 108
AUTHORS: Rodrigues, J; Ben Sedrine, N; Felizardo, M ; Soares, MJ; Alves, E; Neves, AJ; Fellmann, V; Tourbot, G; Auzelle, T; Daudin, B; Bockowski, M; Lorenz, K; Monteiro, T;
PUBLISHED: 2014, SOURCE: RSC ADVANCES, VOLUME: 4, ISSUE: 108
14
TITLE: Bandgap Engineering and Optical Constants of YxAl1-xN Alloys
AUTHORS: Nebiha Ben Sedrine; Agne Zukauskaite; Jens Birch; Lars Hultman; Vanya Darakchieva;
PUBLISHED: 2013, SOURCE: JAPANESE JOURNAL OF APPLIED PHYSICS, VOLUME: 52, ISSUE: 8
AUTHORS: Nebiha Ben Sedrine; Agne Zukauskaite; Jens Birch; Lars Hultman; Vanya Darakchieva;
PUBLISHED: 2013, SOURCE: JAPANESE JOURNAL OF APPLIED PHYSICS, VOLUME: 52, ISSUE: 8
15
TITLE: Spectroscopic ellipsometry of AP-MOVPE-grown GaAs1−xBix dilute alloys
AUTHORS: Ben Sedrine, N;
PUBLISHED: 2013, SOURCE: Springer Series in Materials Science, VOLUME: 186
AUTHORS: Ben Sedrine, N;
PUBLISHED: 2013, SOURCE: Springer Series in Materials Science, VOLUME: 186
INDEXED IN:
Scopus

16
TITLE: Temperature dependent effective mass in AlGaN/GaN high electron mobility transistor structures Full Text
AUTHORS: Hofmann, T; Kuehne, P; Schoeche, S; Jr Tai Chen; Forsberg, U; Janzen, E; Ben Sedrine, N; Herzinger, CM; Woollam, JA; Schubert, M; Darakchieva, V;
PUBLISHED: 2012, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 101, ISSUE: 19
AUTHORS: Hofmann, T; Kuehne, P; Schoeche, S; Jr Tai Chen; Forsberg, U; Janzen, E; Ben Sedrine, N; Herzinger, CM; Woollam, JA; Schubert, M; Darakchieva, V;
PUBLISHED: 2012, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 101, ISSUE: 19
17
TITLE: YxAl1-xN thin films Full Text
AUTHORS: Agne Zukauskaite; Christopher Tholander; Justinas Palisaitis; Per O A Persson; Vanya Darakchieva; Nebiha Ben Sedrine; Ferenc Tasnadi; Bjorn Alling; Jens Birch; Lars Hultman;
PUBLISHED: 2012, SOURCE: JOURNAL OF PHYSICS D-APPLIED PHYSICS, VOLUME: 45, ISSUE: 42
AUTHORS: Agne Zukauskaite; Christopher Tholander; Justinas Palisaitis; Per O A Persson; Vanya Darakchieva; Nebiha Ben Sedrine; Ferenc Tasnadi; Bjorn Alling; Jens Birch; Lars Hultman;
PUBLISHED: 2012, SOURCE: JOURNAL OF PHYSICS D-APPLIED PHYSICS, VOLUME: 45, ISSUE: 42
INDEXED IN:
Scopus
WOS


18
TITLE: Y x Al 1− x N thin films Full Text
AUTHORS: Agnė Žukauskaitė; Christopher Tholander; Justinas Palisaitis; Per O Å Persson; Vanya Darakchieva; Nebiha Ben Sedrine; Ferenc Tasnádi; Björn Alling; Jens Birch; Lars Hultman;
PUBLISHED: 2012, SOURCE: Journal of Physics D: Applied Physics - J. Phys. D: Appl. Phys., VOLUME: 45, ISSUE: 42
AUTHORS: Agnė Žukauskaitė; Christopher Tholander; Justinas Palisaitis; Per O Å Persson; Vanya Darakchieva; Nebiha Ben Sedrine; Ferenc Tasnádi; Björn Alling; Jens Birch; Lars Hultman;
PUBLISHED: 2012, SOURCE: Journal of Physics D: Applied Physics - J. Phys. D: Appl. Phys., VOLUME: 45, ISSUE: 42
INDEXED IN:
CrossRef

19
TITLE: Infrared ellipsometry and near-infrared-to-vacuum-ultraviolet ellipsometry study of free-charge carrier properties in In-polar p-type InN
AUTHORS: Stefan Schöche; Tino Hofmann; Nebiha Ben Sedrine; Vanya Darakchieva; Xinqiang Wang; Akihiko Yoshikawa; Mathias Schubert;
PUBLISHED: 2012, SOURCE: MRS Proc. - MRS Proceedings, VOLUME: 1396
AUTHORS: Stefan Schöche; Tino Hofmann; Nebiha Ben Sedrine; Vanya Darakchieva; Xinqiang Wang; Akihiko Yoshikawa; Mathias Schubert;
PUBLISHED: 2012, SOURCE: MRS Proc. - MRS Proceedings, VOLUME: 1396
INDEXED IN:
CrossRef

20
TITLE: Optical properties of GaAs0.9-xNxSb0.1 alloy films studied by spectroscopic ellipsometry Full Text
AUTHORS: Ben Sedrine, N; Bouhafs, C; Schubert, M; Harmand, JC; Chtourou, R; Darakchieva, V;
PUBLISHED: 2011, SOURCE: 5th International Conference on Spectroscopic Ellipsometry in THIN SOLID FILMS, VOLUME: 519, ISSUE: 9
AUTHORS: Ben Sedrine, N; Bouhafs, C; Schubert, M; Harmand, JC; Chtourou, R; Darakchieva, V;
PUBLISHED: 2011, SOURCE: 5th International Conference on Spectroscopic Ellipsometry in THIN SOLID FILMS, VOLUME: 519, ISSUE: 9