131
TITLE: Tuning the surface morphology in self-organized ion beam nanopatterning of Si(001) via metal incorporation: from holes to dots  Full Text
AUTHORS: Sánchez-García, JA; Vázquez, L; Gago, R; Redondo-Cubero, A; Albella, JM; Zs Czigány;
PUBLISHED: 2008, SOURCE: Nanotechnology, VOLUME: 19, ISSUE: 35
INDEXED IN: CrossRef
IN MY: ORCID
132
TITLE: Study of SiN<inf>x</inf>:H<inf>y</inf> passivant layers for AlGaN/GaN high electron mobility transistors
AUTHORS: Redondo-Cubero A.; Gago R.; Romero M.F.; Jiménez A.; González-Posada F.; Braña A.F.; Muñoz E.;
PUBLISHED: 2008, SOURCE: Physica Status Solidi (C) Current Topics in Solid State Physics, VOLUME: 5, ISSUE: 2
INDEXED IN: Scopus
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133
TITLE: Effect of the growth temperature and the AlN mole fraction on in incorporation and properties of quaternary III-nitride layers grown by molecular beam epitaxy
AUTHORS: Fernández-Garrido S.; Redondo-Cubero A.; Gago R.; Bertram F.; Christen J.; Luna E.; Trampert A.; Pereiro J.; Muoz E.; Calleja E.;
PUBLISHED: 2008, SOURCE: Journal of Applied Physics, VOLUME: 104, ISSUE: 8
INDEXED IN: Scopus
IN MY: ORCID
134
TITLE: Aluminium incorporation in Al<inf>x</inf>Ga<inf>1 - x</inf>N/GaN heterostructures: A comparative study by ion beam analysis and X-ray diffraction
AUTHORS: Redondo-Cubero A.; Gago R.; González-Posada F.; Kreissig U.; di Forte Poisson M.A.; Braña A.F.; Muñoz E.;
PUBLISHED: 2008, SOURCE: Thin Solid Films, VOLUME: 516, ISSUE: 23
INDEXED IN: Scopus
IN MY: ORCID
135
TITLE: Tuning the surface morphology in self-organized ion beam nanopatterning of Si(001) via metal incorporation: From holes to dots
AUTHORS: Sánchez-García J.A.; Vázquez L.; Gago R.; Redondo-Cubero A.; Albella J.M.; Zs Czigány;
PUBLISHED: 2008, SOURCE: Nanotechnology, VOLUME: 19, ISSUE: 35
INDEXED IN: Scopus
IN MY: ORCID
136
TITLE: Photoluminescence enhancement in quaternary III-nitrides alloys grown by molecular beam epitaxy with increasing Al content
AUTHORS: Fernández-Garrido S.; Pereiro J.; González-Posada F.; Muoz E.; Calleja E.; Redondo-Cubero A.; Gago R.;
PUBLISHED: 2008, SOURCE: Journal of Applied Physics, VOLUME: 103, ISSUE: 4
INDEXED IN: Scopus
IN MY: ORCID
137
TITLE: Rutherford backscattering spectrometry characterization of nanoporous chalcogenide thin films grown at oblique angles
AUTHORS: Martín-Palma R.J.; Redondo-Cubero A.; Gago R.; Ryan J.V.; Pantano C.G.;
PUBLISHED: 2008, SOURCE: Journal of Analytical Atomic Spectrometry, VOLUME: 23, ISSUE: 7
INDEXED IN: Scopus
IN MY: ORCID
Page 14 of 14. Total results: 137.