51
TITLE: Quantum Well Intermixing and Radiation Effects in InGaN/GaN Multi Quantum Wells
AUTHORS: Lorenz, K; Redondo Cubero, A; Lourenco, MB; Sequeira, MC; Peres, M; Freitas, A; Alves, LC; Alves, E; Leitao, MP; Rodrigues, J; Ben Sedrine, N; Correia, MR; Monteiro, T;
PUBLISHED: 2016, SOURCE: Conference on Gallium Nitride Materials and Devices XI in GALLIUM NITRIDE MATERIALS AND DEVICES XI, VOLUME: 9748
INDEXED IN: Scopus WOS CrossRef: 1
IN MY: ORCID
52
TITLE: Self-organised silicide nanodot patterning by medium-energy ion beam sputtering of Si (100): local correlation between the morphology and metal content
AUTHORS: Redondo Cubero, A; Galiana, B; Lorenz, K; Palomares, FJ; Bahena, D; Ballesteros, C; Hernandez Calderon, I; Vazquez, L;
PUBLISHED: 2016, SOURCE: NANOTECHNOLOGY, VOLUME: 27, ISSUE: 44
INDEXED IN: Scopus WOS CrossRef: 12
IN MY: ORCID
53
TITLE: Ion-beam induced effects in multi-layered semiconductor systems
AUTHORS: Wendler, E; Sobolev, NA; Redondo Cubero, A; Lorenz, K;
PUBLISHED: 2016, SOURCE: PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, VOLUME: 253, ISSUE: 11
INDEXED IN: Scopus WOS CrossRef: 2
IN MY: ORCID
54
TITLE: Analysis of Zinc Nitride Resistive Indicators under Different Relative Humidity Conditions
AUTHORS: Gómez Castaño, M; Redondo Cubero, A; Vázquez, L; Pau, JL;
PUBLISHED: 2016, SOURCE: ACS APPLIED MATERIALS & INTERFACES, VOLUME: 8, ISSUE: 42
INDEXED IN: Scopus WOS
IN MY: ORCID
55
TITLE: Bonding structure and morphology of chromium oxide films grown by pulsed-DC reactive magnetron sputter deposition
AUTHORS: Gago, R; Vinnichenko, M; Hübner, R; Redondo Cubero, A;
PUBLISHED: 2016, SOURCE: JOURNAL OF ALLOYS AND COMPOUNDS, VOLUME: 672
INDEXED IN: Scopus WOS CrossRef: 19
IN MY: ORCID
56
TITLE: Analysis of Zinc Nitride Resistive Indicators under Different Relative Humidity Conditions
AUTHORS: Gómez-Castaño, M; Redondo-Cubero, A; Vázquez, L; Pau, JL;
PUBLISHED: 2016, SOURCE: ACS Applied Materials & Interfaces, VOLUME: 8, ISSUE: 42
INDEXED IN: CrossRef: 20
IN MY: ORCID
57
TITLE: Ion damage overrides structural disorder in silicon surface nanopatterning by low-energy ion beam sputtering
AUTHORS: Moreno Barrado, A; Gago, R; Redondo Cubero, A; Vazquez, L; Munoz Garcia, J; Cuerno, R; Lorenz, K; Castro, M;
PUBLISHED: 2015, SOURCE: EPL, VOLUME: 109, ISSUE: 4
INDEXED IN: Scopus WOS
58
TITLE: Luminescence studies on green emitting InGaN/GaN MQWs implanted with nitrogen  Full Text
AUTHORS: Marco A Sousa; Teresa C Esteves; Nabiha Ben Sedrine; Joana Rodrigues; Marcio B Lourenco; Andres Redondo Cubero; Eduardo Alves; Kevin P O'Donnell; Michal Bockowski; Christian Wetzel; Maria R Correia; Katharina Lorenz; Teresa Monteiro;
PUBLISHED: 2015, SOURCE: SCIENTIFIC REPORTS, VOLUME: 5
INDEXED IN: Scopus WOS CrossRef: 13
59
TITLE: Self-consistent depth profiling and imaging of GaN-based transistors using ion microbeams  Full Text
AUTHORS: Redondo Cubero, A; Corregidor, V; Vazquez, L; Alves, LC;
PUBLISHED: 2015, SOURCE: 14th International Conference on Nuclear Microprobe Technology and Applications (ICNMTA) / Workshop on Proton Beam Writing in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 348
INDEXED IN: Scopus WOS
60
TITLE: Nonuniversality due to inhomogeneous stress in semiconductor surface nanopatterning by low-energy ion-beam irradiation
AUTHORS: Moreno Barrado, A; Castro, M; Gago, R; Vazquez, L; Munoz Garcia, J; Redondo Cubero, A; Galiana, B; Ballesteros, C; Cuerno, R;
PUBLISHED: 2015, SOURCE: PHYSICAL REVIEW B, VOLUME: 91, ISSUE: 15
INDEXED IN: WOS
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