Eduardo Jorge da Costa Alves
AuthID: R-000-4EK
31
TITLE: Microwave transient reflection in annealed SnS thin films Full Text
AUTHORS: Ben Mbarek, M; Reghima, M; Yacoubi, N; Barradas, N; Alves, E; Bundaleski, N; Teodoro, O ; Kunst, M; Schwarz, R;
PUBLISHED: 2021, SOURCE: Spring Meeting of the European-Materials-Research-Society (E-MRS) / Symposium E on Earth-Abundant Next Generation Materials for Solar Energy - III in MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, VOLUME: 121
AUTHORS: Ben Mbarek, M; Reghima, M; Yacoubi, N; Barradas, N; Alves, E; Bundaleski, N; Teodoro, O ; Kunst, M; Schwarz, R;
PUBLISHED: 2021, SOURCE: Spring Meeting of the European-Materials-Research-Society (E-MRS) / Symposium E on Earth-Abundant Next Generation Materials for Solar Energy - III in MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, VOLUME: 121
32
TITLE: Electrical, optical and photoconductive properties of Sn-doped indium sulfofluoride thin films Full Text
AUTHORS: Vygranenko, Y; Fernandes, M; Vieira, M; Lavareda, G; de Carvalho, CN; Brogueira, P; Amaral, A; Barradas, NP; Alves, E;
PUBLISHED: 2021, SOURCE: MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, VOLUME: 121
AUTHORS: Vygranenko, Y; Fernandes, M; Vieira, M; Lavareda, G; de Carvalho, CN; Brogueira, P; Amaral, A; Barradas, NP; Alves, E;
PUBLISHED: 2021, SOURCE: MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, VOLUME: 121
33
TITLE: Dependence of optical properties on composition of silicon carbonitride thin films deposited at low temperature by PECVD Full Text
AUTHORS: Lavareda, G; Vygranenko, Y; Amaral, A; de Carvalho, CN; Barradas, NP; Alves, E; Brogueira, P;
PUBLISHED: 2021, SOURCE: JOURNAL OF NON-CRYSTALLINE SOLIDS, VOLUME: 551
AUTHORS: Lavareda, G; Vygranenko, Y; Amaral, A; de Carvalho, CN; Barradas, NP; Alves, E; Brogueira, P;
PUBLISHED: 2021, SOURCE: JOURNAL OF NON-CRYSTALLINE SOLIDS, VOLUME: 551
34
TITLE: Eu3+ optical activation engineering in AlxGa1-xN nanowires for red solid-state nano-emitters
AUTHORS: Cardoso, J; Jacopin, G; Faye, DN; Siladie, AM; Daudin, B; Alves, E; Lorenz, K; Monteiro, T; Correia, MR; Ben Sedrine, N;
PUBLISHED: 2021, SOURCE: APPLIED MATERIALS TODAY, VOLUME: 22
AUTHORS: Cardoso, J; Jacopin, G; Faye, DN; Siladie, AM; Daudin, B; Alves, E; Lorenz, K; Monteiro, T; Correia, MR; Ben Sedrine, N;
PUBLISHED: 2021, SOURCE: APPLIED MATERIALS TODAY, VOLUME: 22
35
TITLE: Unravelling the secrets of the resistance of GaN to strongly ionising radiation
AUTHORS: Sequeira, MC; Mattei, JG; Vazquez, H; Djurabekova, F; Nordlund, K; Monnet, I; Mota Santiago, P; Kluth, P; Grygiel, C; Zhang, S; Alves, E; Lorenz, K;
PUBLISHED: 2021, SOURCE: COMMUNICATIONS PHYSICS, VOLUME: 4, ISSUE: 1
AUTHORS: Sequeira, MC; Mattei, JG; Vazquez, H; Djurabekova, F; Nordlund, K; Monnet, I; Mota Santiago, P; Kluth, P; Grygiel, C; Zhang, S; Alves, E; Lorenz, K;
PUBLISHED: 2021, SOURCE: COMMUNICATIONS PHYSICS, VOLUME: 4, ISSUE: 1
36
TITLE: Crystal mosaicity determined by a novel layer deconvolution Williamson-Hall method Full Text
AUTHORS: Magalhães, S; Cabaço, JS; Mateus, R; Faye, DN; Pereira, DR; Peres, M; Lorenz, K; Díaz Guerra, C; Araújo, JP; Alves, E;
PUBLISHED: 2021, SOURCE: CrystEngComm, VOLUME: 23, ISSUE: 10
AUTHORS: Magalhães, S; Cabaço, JS; Mateus, R; Faye, DN; Pereira, DR; Peres, M; Lorenz, K; Díaz Guerra, C; Araújo, JP; Alves, E;
PUBLISHED: 2021, SOURCE: CrystEngComm, VOLUME: 23, ISSUE: 10
37
TITLE: Multiple reflection optimization package for X-ray diffraction Full Text
AUTHORS: Magalhaes, S; Cabaco, JS; Araujo, JP; Alves, E;
PUBLISHED: 2021, SOURCE: CRYSTENGCOMM
AUTHORS: Magalhaes, S; Cabaco, JS; Araujo, JP; Alves, E;
PUBLISHED: 2021, SOURCE: CRYSTENGCOMM
INDEXED IN: 
WOS
WOS38
TITLE: Self-powered proton detectors based on GaN core-shell p-n microwires Full Text
AUTHORS: Verheij, D; Peres, M; Cardoso, S; Alves, LC; Alves, E; Durand, C; Eymery, J; Fernandes, J; Lorenz, K;
PUBLISHED: 2021, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 118, ISSUE: 19
AUTHORS: Verheij, D; Peres, M; Cardoso, S; Alves, LC; Alves, E; Durand, C; Eymery, J; Fernandes, J; Lorenz, K;
PUBLISHED: 2021, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 118, ISSUE: 19
40
TITLE: An insider view of the Portuguese ion beam laboratory
AUTHORS: Alves, E; Lorenz, K; Catarino, N; Peres, M; Dias, M; Mateus, R; Alves, LC; Corregidor, V; Barradas, NP; Fonseca, M; Cruz, J ; Jesus, A;
PUBLISHED: 2021, SOURCE: EUROPEAN PHYSICAL JOURNAL PLUS, VOLUME: 136, ISSUE: 6
AUTHORS: Alves, E; Lorenz, K; Catarino, N; Peres, M; Dias, M; Mateus, R; Alves, LC; Corregidor, V; Barradas, NP; Fonseca, M; Cruz, J ; Jesus, A;
PUBLISHED: 2021, SOURCE: EUROPEAN PHYSICAL JOURNAL PLUS, VOLUME: 136, ISSUE: 6
