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TITLE: Erbium-doped silicon nanocrystals grown by r.f. sputtering method: Competition between oxygen and silicon to get erbium  Full Text
AUTHORS: Cerqueira, MF; Stepikhova, M; Losurdo, M; Giangregorio, MM; Kozanecki, A; Monteiro, T ;
PUBLISHED: 2006, SOURCE: Meeting of the European-Materials-Research-Society in OPTICAL MATERIALS, VOLUME: 28, ISSUE: 6-7
INDEXED IN: Scopus WOS CrossRef: 4
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TITLE: Dielectric function of nanocrystalline silicon with few nanometers (< 3 nm) grain size  Full Text
AUTHORS: Losurdo, M; Giangregorio, MM; Capezzuto, P; Bruno, G; Cerqueira, MF ; Alves, E ; Stepikhova, M;
PUBLISHED: 2003, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 82, ISSUE: 18
INDEXED IN: Scopus WOS CrossRef
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TITLE: Influence of crystals distribution on the photoluminescence properties of nanocrystalline silicon thin films  Full Text
AUTHORS: Cerqueira, MF ; Stepikhova, M; Losurdo, M; Giangregorio, MM; Alves, E ; Monteiro, T ; Soares, MJ ; Boemare, C;
PUBLISHED: 2003, SOURCE: Conference on Low Dimensional Structures and Devices (LDSD) in MICROELECTRONICS JOURNAL, VOLUME: 34, ISSUE: 5-8
INDEXED IN: Scopus WOS CrossRef: 1
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TITLE: Interrelation between microstructure and optical properties of erbium-doped nanocrystalline thin films  Full Text
AUTHORS: Losurdo, M; Cerqueira, MF ; Alves, E ; Stepikhova, MV; Giangregorio, MM; Bruno, G;
PUBLISHED: 2003, SOURCE: Spring Meeting of the European-Materials-Research-Society (E-MRS) in PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, VOLUME: 16, ISSUE: 3-4
INDEXED IN: Scopus WOS CrossRef
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TITLE: Spectroscopic ellipsometry study of the layer structure and impurity content in Er-doped nanocrystalline silicon thin films  Full Text
AUTHORS: Losurdo, M; Cerqueira, MF ; Stepikhova, MV; Alves, E ; Giangregorio, MM; Pinto, P; Ferreira, JA;
PUBLISHED: 2001, SOURCE: 21st International Conference on Defects in Semiconductors in PHYSICA B-CONDENSED MATTER, VOLUME: 308
INDEXED IN: Scopus WOS CrossRef: 3