Piotr Kruszewski
AuthID: R-00F-CC2
1
TITLE: Trap levels in the atomic layer deposition-ZnO/GaN heterojunction-Thermal admittance spectroscopy studies Full Text
AUTHORS: Tomasz A Krajewski; Peter Stallinga ; Eunika Zielony; Krzysztof Goscinski; Piotr Kruszewski; Lukasz Wachnicki; Timo Aschenbrenner; Detlef Hommel; Elzbieta Guziewicz; Marek Godlewski;
PUBLISHED: 2013, SOURCE: JOURNAL OF APPLIED PHYSICS, VOLUME: 113, ISSUE: 19
AUTHORS: Tomasz A Krajewski; Peter Stallinga ; Eunika Zielony; Krzysztof Goscinski; Piotr Kruszewski; Lukasz Wachnicki; Timo Aschenbrenner; Detlef Hommel; Elzbieta Guziewicz; Marek Godlewski;
PUBLISHED: 2013, SOURCE: JOURNAL OF APPLIED PHYSICS, VOLUME: 113, ISSUE: 19
