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TITLE: Aluminium incorporation in AlxGa1−xN/GaN heterostructures: A comparative study by ion beam analysis and X-ray diffraction  Full Text
AUTHORS: Redondo-Cubero, A; Gago, R; González-Posada, F; Kreissig, U; M.-A di Forte Poisson; A.F Braña; Muñoz, E;
PUBLISHED: 2008, SOURCE: Thin Solid Films, VOLUME: 516, ISSUE: 23
INDEXED IN: CrossRef