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TITLE: Turning solid aluminium transparent by intense soft X-ray photoionization  Full Text
AUTHORS: Bob Nagler; Ulf Zastrau; Roland R Faeustlin; Sam M Vinko; Thomas Whitcher; Nelson, AJ; Ryszard Sobierajski; Jacek Krzywinski; Jaromir Chalupsky; Elsa Abreu; Sasa Bajt; Thomas Bornath; Tomas Burian; Henry Chapman; Jaroslav Cihelka; Tilo Doeppner; Stefan Duesterer; Thomas Dzelzainis; Marta Fajardo ; Eckhart Foerster; Carsten Fortmann; Eric Galtier; Siegfried H Glenzer; Sebastian Goede; Gianluca Gregori; Vera Hajkova; Phil Heimann; Libor Juha; Marek Jurek; Fida Y Khattak; Ali Reza Khorsand; Dorota Klinger; Michaela Kozlova; Tim Laarmann; Hae Ja Lee; Richard W Lee; Karl Heinz Meiwes Broer; Pascal Mercere; William J Murphy; Andreas Przystawik; Ronald Redmer; Heidi Reinholz; David Riley; Gerd Roepke; Frank Rosmej; Karel Saksl; Romain Schott; Robert Thiele; Josef Tiggesbaeumker; Sven Toleikis; Thomas Tschentscher; Ingo Uschmann; Hubert J Vollmer; Justin S Wark; ...More
PUBLISHED: 2009, SOURCE: NATURE PHYSICS, VOLUME: 5, ISSUE: 9
INDEXED IN: Scopus WOS CrossRef
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TITLE: Perspective for high energy density studies using x-ray free electron lasers
AUTHORS: Lee, RW; Nagler, B; Zastrau, U; Faustlin, R; Vinko, S; Whitcher, T; Sobierajski, R; Krzywinski, J; Juha, L; Nelson, A; Bajt, S; Bornath, T; Burian, T; Chalupsky, J; Chapman, H; Cihelka, J; Doppner, T; Dzelzainis, T; Dusterer, S; Fajardo, M ; Forster, E; Fortmann, C; Glenzer, SH; Gode, S; Gregori, G; Hajkova, V; Heimann, P; Jurek, M; Khattak, F; Khorsand, AR; Klinger, D; Kozlova, M; Laarmann, T; Lee, H; Meiwes Broer, K; Mercere, P; Murphy, WJ; Przystawik, A; Redmer, R; Reinholz, H; Riley, D; Ropke, G; Saksl, K; Thiele, R; Tiggesbaumker, J; Toleikis, S; Tschentscher, T; Uschmann, I; Wark, JS; ...More
PUBLISHED: 2009, SOURCE: 2009 IEEE International Conference on Plasma Science - Abstracts, ICOPS 2009 in IEEE International Conference on Plasma Science
INDEXED IN: Scopus CrossRef
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TITLE: Perspective for high energy density studies on X-ray FELs
AUTHORS: Lee, RW; Nagler, B; Zastrau, U; Faustlin, R; Vinko, SM; Whitcher, T; Sobierajski, R; Krzywinski, J; Juha, L; Nelson, AJ; Bajt, S; Budil, K; Cauble, RC; Bornath, T; Burian, T; Chalupsky, J; Chapman, H; Cihelka, J; Doppner, T; Dzelzainis, T; Dusterer, S; Ajardo, M; Forster, E; Fortmann, C; Glenzer, SH; Gode, S; Gregori, G; Hajkova, V; Heimann, P; Jurek, M; Khattak, FY; Khorsand, AR; Klinger, D; Kozlova, M; Laarmann, T; Lee, HJ; Meiwes Broer, KH; Mercere, P; Murphy, WJ; Przystawik, A; Redmer, R; Reinholz, H; Riley, D; Ropke, G; Saksl, K; Thiele, R; Tiggesbaumker, J; Toleikis, S; Tschentscher, T; Uschmann, I; Falcone, RW; Shepherd, R; Hastings, JB; White, WE; Wark, JS; ...More
PUBLISHED: 2009, SOURCE: Soft X-Ray Lasers and Applications VIII in Proceedings of SPIE - The International Society for Optical Engineering, VOLUME: 7451
INDEXED IN: Scopus CrossRef