Francisco Andre Correa Alegria


AuthID: R-000-59K

Publications Awaiting Confirmation

31
TITLE: Design, Characterization and Calibration of a Short-Period Ocean Bottom Seismometer (OBS)
AUTHORS: Shariat Panahi, S; Manuel, A; Alegria, F; Roset, X; Bermudez, A; Sallares, V;
PUBLISHED: 2008, SOURCE: 25th IEEE Instrumentation and Measurement Technology Conference in 2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5
INDEXED IN: Scopus WOS
IN MY: ORCID
32
TITLE: Design, Characterization and Calibration of a Short-Period Ocean Bottom Seismometer (OBS)
AUTHORS: Shariat-Panahi, S; Manuel, A; Alegria, F; Roset, X; Bermudez, A; Sallares, V;
PUBLISHED: 2008, SOURCE: 2008 IEEE Instrumentation and Measurement Technology Conference
INDEXED IN: CrossRef
IN MY: ORCID
33
TITLE: Characterization of a high resolution acquisition system for marine geophysical applications  Full Text
AUTHORS: Panahi, SS; Alegria, F; Manuel, A;
PUBLISHED: 2006, SOURCE: IMTC'06 - IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference
INDEXED IN: Scopus CrossRef
IN MY: ORCID
34
TITLE: Uncertainty of estimates obtained with the histogram test of ADCS
AUTHORS: Alegria, FC; Serra, AC ;
PUBLISHED: 2006, SOURCE: 18th IMEKO World Congress 2006: Metrology for a Sustainable Development in 18th IMEKO World Congress 2006: Metrology for a Sustainable Development, VOLUME: 3
INDEXED IN: Scopus
IN MY: ORCID
35
TITLE: Signal Discrimination in Superheated Droplet Detectors
AUTHORS: Felizardo, M; R.C Martins; A.R Ramos; Morlat, T; Giuliani, F; J.G Marques; Limagne, D; Waysand, G; A.C Fernandes; T.A Girard; Alegria, F;
PUBLISHED: 2006, SOURCE: 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings
INDEXED IN: CrossRef
IN MY: ORCID
36
TITLE: Signal discrimination in superheated droplet detectors
AUTHORS: Felizardo, M ; Martins, RC ; Ramos, AR ; Morlat, T; Giuliani, F; Marques, JG ; Limagne, D; Waysand, G; Fernandes, AC ; Girard, TA ; Alegria, F;
PUBLISHED: 2005, SOURCE: IMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2
INDEXED IN: Scopus
IN MY: ORCID
37
TITLE: Precision of ADC gain and offset error estimation with the standard histogram test
AUTHORS: Alegria, FC; Serra, AC ;
PUBLISHED: 2005, SOURCE: IMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 1
INDEXED IN: Scopus
IN MY: ORCID
Page 4 of 4. Total results: 37.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service