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TITLE: Self-adaptive sampling rate data acquisition in JET's correlation reflectometer  Full Text
AUTHORS: de Arcas, G; López, JM; Ruiz, M; Barrera, E; Vega, J; Murari, A; Fonseca, A; JET-EFDA Contributors, ;
PUBLISHED: 2008, SOURCE: 17th Topical Conference on High-Temperature Plasma Diagnostics in REVIEW OF SCIENTIFIC INSTRUMENTS, VOLUME: 79, ISSUE: 10
INDEXED IN: Scopus WOS CrossRef