G. P. Gololobov
AuthID: R-00G-XTR
1
TITLE: Quantitative depth profiling of Si1-xGex structures by time-of-flight secondary ion mass spectrometry and secondary neutral mass spectrometry Full Text
AUTHORS: Drozdov, MN; Drozdov, YN; Csik, A; Novikov, AV; Vad, K; Yunin, PA; Yurasov, DV; Belykh, SF; Gololobov, GP; Suvorov, DV; Tolstogouzov, A;
PUBLISHED: 2016, SOURCE: THIN SOLID FILMS, VOLUME: 607
AUTHORS: Drozdov, MN; Drozdov, YN; Csik, A; Novikov, AV; Vad, K; Yunin, PA; Yurasov, DV; Belykh, SF; Gololobov, GP; Suvorov, DV; Tolstogouzov, A;
PUBLISHED: 2016, SOURCE: THIN SOLID FILMS, VOLUME: 607
2
TITLE: Vacuum solid-state ion-conducting silver source for application in field emission electric propulsion systems Full Text
AUTHORS: Alexander Tolstogouzov; Hugo Aguas; Rachid Ayouchi ; Sergey F Belykh; Fabio Fernandes; Gennady P Gololobov; Augusto M C Moutinho; Reinhard Schwarz; Dmitry V Suvorov; Orlando M N D Teodoro ;
PUBLISHED: 2016, SOURCE: VACUUM, VOLUME: 131
AUTHORS: Alexander Tolstogouzov; Hugo Aguas; Rachid Ayouchi ; Sergey F Belykh; Fabio Fernandes; Gennady P Gololobov; Augusto M C Moutinho; Reinhard Schwarz; Dmitry V Suvorov; Orlando M N D Teodoro ;
PUBLISHED: 2016, SOURCE: VACUUM, VOLUME: 131
