D. V. Yurasov
AuthID: R-00H-016
1
TITLE: Quantitative depth profiling of Si1-xGex structures by time-of-flight secondary ion mass spectrometry and secondary neutral mass spectrometry Full Text
AUTHORS: Drozdov, MN; Drozdov, YN; Csik, A; Novikov, AV; Vad, K; Yunin, PA; Yurasov, DV; Belykh, SF; Gololobov, GP; Suvorov, DV; Tolstogouzov, A;
PUBLISHED: 2016, SOURCE: THIN SOLID FILMS, VOLUME: 607
AUTHORS: Drozdov, MN; Drozdov, YN; Csik, A; Novikov, AV; Vad, K; Yunin, PA; Yurasov, DV; Belykh, SF; Gololobov, GP; Suvorov, DV; Tolstogouzov, A;
PUBLISHED: 2016, SOURCE: THIN SOLID FILMS, VOLUME: 607
