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TITLE: Low-Frequency Diffusion Noise in Resistive-Switching Memories Based on Metal-Oxide Polymer Structure
AUTHORS: Paulo R F Rocha; Henrique Leonel Gomes ; Lode K J Vandamme; Qian Chen; Asal Kiazadeh; Dago M de Leeuw; Stefan C J Meskers;
PUBLISHED: 2012, SOURCE: IEEE TRANSACTIONS ON ELECTRON DEVICES, VOLUME: 59, ISSUE: 9
INDEXED IN: Scopus WOS CrossRef
2
TITLE: Dynamics of charge carrier trapping in NO2 sensors based on ZnO field-effect transistors  Full Text
AUTHORS: Anne Marije Andringa; Nynke Vlietstra; Edsger C P Smits; Mark Jan Spijkman; Henrique L Gomes ; Johan H Klootwijk; Paul W M Blom; Dago M de Leeuw;
PUBLISHED: 2012, SOURCE: SENSORS AND ACTUATORS B-CHEMICAL, VOLUME: 171
INDEXED IN: Scopus WOS CrossRef
3
TITLE: Ultralow Power Microfuses for Write-Once Read-Many Organic Memory Elements  Full Text
AUTHORS: Bianca C de Brito; Edsger C P Smits; Paid A van Hal; Tom C T Geuns; Bert de Boer; Clemens J M Lasance; Henrique L Gomes ; Dago M de Leeuw;
PUBLISHED: 2008, SOURCE: ADVANCED MATERIALS, VOLUME: 20, ISSUE: 19
INDEXED IN: Scopus WOS CrossRef
4
TITLE: Dynamics of threshold voltage shifts in organic and amorphous silicon field-effect transistors  Full Text
AUTHORS: Simon G J Mathijssen; Michael Colle; Henrique Gomes ; Edsger C P Smits; Bert de Boer; Iain McCulloch; Peter A Bobbert; Dago M de Leeuw;
PUBLISHED: 2007, SOURCE: ADVANCED MATERIALS, VOLUME: 19, ISSUE: 19
INDEXED IN: Scopus WOS CrossRef
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TITLE: Organic materials for active layers in transistors: Study of the electrical stability properties
AUTHORS: Gomes, HL ; Stallinga, P ; de Leeuw, DM;
PUBLISHED: 2006, SOURCE: 3rd International Materials Symposium/12th Meeting of the Sociedad-Portuguesa-da-Materials (Materials 2005/SPM) in ADVANCED MATERIALS FORUM III, PTS 1 AND 2, VOLUME: 514-516, ISSUE: PART 1
INDEXED IN: Scopus WOS