Rene Just
AuthID: R-00H-KQ3
1
TITLE: FRAFOL: FRAmework FOr Learning mutation testing
AUTHORS: Tavares, Pedro; Paiva, Ana ; Amalfitano, Domenico; Just, Rene;
PUBLISHED: 2024, SOURCE: 33rd ACM SIGSOFT International Conference on Software Testing and Analysis (ISSTA) in PROCEEDINGS OF THE 33RD ACM SIGSOFT INTERNATIONAL SYMPOSIUM ON SOFTWARE TESTING AND ANALYSIS, ISSTA 2024
AUTHORS: Tavares, Pedro; Paiva, Ana ; Amalfitano, Domenico; Just, Rene;
PUBLISHED: 2024, SOURCE: 33rd ACM SIGSOFT International Conference on Software Testing and Analysis (ISSTA) in PROCEEDINGS OF THE 33RD ACM SIGSOFT INTERNATIONAL SYMPOSIUM ON SOFTWARE TESTING AND ANALYSIS, ISSTA 2024
2
TITLE: Proceedings of the 32nd ACM SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2023, Seattle, WA, USA, July 17-21, 2023
AUTHORS: René Just; Gordon Fraser;
PUBLISHED: 2023, SOURCE: ISSTA
AUTHORS: René Just; Gordon Fraser;
PUBLISHED: 2023, SOURCE: ISSTA
INDEXED IN: 
DBLP
DBLP3
TITLE: How Do Java Mutation Tools Differ? Full Text
AUTHORS: Amalfitano, Domenico; Paiva, Ana C. R. ; Inquel, Alexis; Pinto, Luis; Fasolino, Anna Rita; Just, Rene;
PUBLISHED: 2022, SOURCE: COMMUNICATIONS OF THE ACM, VOLUME: 65, ISSUE: 12
AUTHORS: Amalfitano, Domenico; Paiva, Ana C. R. ; Inquel, Alexis; Pinto, Luis; Fasolino, Anna Rita; Just, Rene;
PUBLISHED: 2022, SOURCE: COMMUNICATIONS OF THE ACM, VOLUME: 65, ISSUE: 12
4
TITLE: Evaluating and improving fault localization
AUTHORS: Pearson, S; Campos, J ; Just, R; Fraser, G; Abreu, R ; Ernst, MD; Pang, D; Keller, B;
PUBLISHED: 2017, SOURCE: 39th IEEE/ACM International Conference on Software Engineering (ICSE) in 2017 IEEE/ACM 39TH INTERNATIONAL CONFERENCE ON SOFTWARE ENGINEERING (ICSE)
AUTHORS: Pearson, S; Campos, J ; Just, R; Fraser, G; Abreu, R ; Ernst, MD; Pang, D; Keller, B;
PUBLISHED: 2017, SOURCE: 39th IEEE/ACM International Conference on Software Engineering (ICSE) in 2017 IEEE/ACM 39TH INTERNATIONAL CONFERENCE ON SOFTWARE ENGINEERING (ICSE)
