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TITLE: CPM-characterization of light and current stressed a-Si:H diodes with nin, pip, and pin structures  Full Text
AUTHORS: Ostendorf, HC; Schwarz, R; Kusian, W; Kruhler, W;
PUBLISHED: 1993, SOURCE: Proceedings of the 23rd IEEE Photovoltaic Specialists Conference in Conference Record of the IEEE Photovoltaic Specialists Conference
INDEXED IN: Scopus