G. Schlichthorl
AuthID: R-00K-4V7
1
TITLE: In situ characterization of the p-Si/NH4F interface during dissolution in the current oscillations regime
AUTHORS: Cattarin, S; Chazalviel, JN; Da Fonseca, C ; Ozanam, F; Peter, LM; Schlichthorl, G; Stumper, J;
PUBLISHED: 1998, SOURCE: Journal of the Electrochemical Society, VOLUME: 145, ISSUE: 2
AUTHORS: Cattarin, S; Chazalviel, JN; Da Fonseca, C ; Ozanam, F; Peter, LM; Schlichthorl, G; Stumper, J;
PUBLISHED: 1998, SOURCE: Journal of the Electrochemical Society, VOLUME: 145, ISSUE: 2
