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TITLE: Quality of reconstituted tailings samples based on their mechanical response
AUTHORS: Oliveira, Joao; Coelho, Paulo; Santos, Luis Araujo ;
PUBLISHED: 2024, SOURCE: 8th International Symposium on Deformation Characteristics of Geomaterials (IS-Porto) in PROCEEDINGS OF THE 8TH INTERNATIONAL SYMPOSIUM ON DEFORMATION CHARACTERISTICS OF GEOMATERIALS, IS-PORTO 2023, VOLUME: 544
INDEXED IN: Scopus WOS CrossRef
3
TITLE: Quantized Digital Amplification Physical Layer Security Schemes
AUTHORS: Pedro Viegas; Paulo Montezuma; Rui Dinis; João Guerreiro; João Pedro Oliveira;
PUBLISHED: 2024, SOURCE: 15th Advanced Doctoral Conference on Computing, Electrical and Industrial Systems, DoCEIS 2024 in IFIP Advances in Information and Communication Technology, VOLUME: 716 IFIPAICT
INDEXED IN: Scopus CrossRef
IN MY: ORCID
4
TITLE: IEEE SSCS–EDS ESSCIRC–ESSDERC 2023 [Conference Reports]
AUTHORS: João Goes; José de la Rosa; Andreia Cathelin; Jorge Fernandes; João Oliveira; Luís Bica de Oliveira; Nuno Paulino;
PUBLISHED: 2024, SOURCE: IEEE Solid-State Circuits Magazine, VOLUME: 16, ISSUE: 1
INDEXED IN: CrossRef
IN MY: ORCID
5
TITLE: A Standard-Cell-Based Neuro-Inspired Integrate-and-Fire Analog-to-Time Converter for Biological and Low-Frequency Signals - Comparison With Analog Version  Full Text
AUTHORS: Teixeira, Miguel Lima; Oliveira, Joao P.; Principe, Jose C.; Goes, Joao;
PUBLISHED: 2024, SOURCE: IEEE TRANSACTIONS ON BIOMEDICAL CIRCUITS AND SYSTEMS, VOLUME: 18, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
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6
TITLE: Design of a 300mV-Supply Schmitt-Trigger-Based DIGOTA for GBW and DC Gain Enhancement in 16nm FinFET
AUTHORS: Ricardo Machado; Pedro Toledo; Luis Oliveira; Miguel Maximo; Mauro Santos; Joao Oliveira;
PUBLISHED: 2024, SOURCE: 8th International Young Engineers Forum on Electrical and Computer Engineering, YEF-ECE 2024 in Proceedings - 8th International Young Engineers Forum on Electrical and Computer Engineering, YEF-ECE 2024
INDEXED IN: Scopus CrossRef
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7
TITLE: Implementation of NMOS-based LDO Using Recycling Folded-Cascode in 16 nm FinFET
AUTHORS: Miguel Maximo; Mauro Santos; Joao Oliveira; Pedro Toledo; Ricardo Machado; Luis Oliveira;
PUBLISHED: 2024, SOURCE: 8th International Young Engineers Forum on Electrical and Computer Engineering, YEF-ECE 2024 in Proceedings - 8th International Young Engineers Forum on Electrical and Computer Engineering, YEF-ECE 2024
INDEXED IN: Scopus CrossRef
IN MY: ORCID
8
TITLE: Comparative analysis of MIG brazing modes: process stability, bead morphology, microstructure, and mechanical properties  Full Text
AUTHORS: Singh, Jaivindra; Arora, Kanwer Singh; Oliveira, Joao P.; Asati, Brajesh;
PUBLISHED: 2024, SOURCE: INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY
INDEXED IN: Scopus WOS
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TITLE: Comparative analysis of MIG brazing modes: Process stability, bead morphology, microstructure, and mechanical properties (Sept, 10.1007/s00170-024-14488-6, 2024)  Full Text
AUTHORS: Singh, Jaivindra; Arora, Kanwer Singh; Oliveira, Joao P.; Asati, Brajesh;
PUBLISHED: 2024, SOURCE: INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY
INDEXED IN: WOS
10
TITLE: Impact and compensation of carrier synchronization errors in OFDM signals with very large QAM constellations
AUTHORS: Mokhtari, Zahra; Dinis, Rui; Oliveira, Luis; Oliveira, Joao;
PUBLISHED: 2023, SOURCE: IET COMMUNICATIONS, VOLUME: 17, ISSUE: 9
INDEXED IN: Scopus WOS CrossRef
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