João Pedro Abreu de Oliveira
AuthID: R-000-7CS
1
TITLE: Machine learning methods, applications and economic analysis to predict heart failure hospitalisation risk: a scoping review protocol Full Text
AUTHORS: Seringa, Joana; Abreu, Joao; Magalhaes, Teresa;
PUBLISHED: 2024, SOURCE: BMJ OPEN, VOLUME: 14, ISSUE: 4
AUTHORS: Seringa, Joana; Abreu, Joao; Magalhaes, Teresa;
PUBLISHED: 2024, SOURCE: BMJ OPEN, VOLUME: 14, ISSUE: 4
INDEXED IN: 
Scopus 
WOS
Scopus WOS2
TITLE: IEEE SSCS–EDS ESSCIRC–ESSDERC 2023 [Conference Reports]
AUTHORS: João Goes; José de la Rosa; Andreia Cathelin; Jorge Fernandes; João Oliveira; Luís Bica de Oliveira; Nuno Paulino;
PUBLISHED: 2024, SOURCE: IEEE Solid-State Circuits Magazine, VOLUME: 16, ISSUE: 1
AUTHORS: João Goes; José de la Rosa; Andreia Cathelin; Jorge Fernandes; João Oliveira; Luís Bica de Oliveira; Nuno Paulino;
PUBLISHED: 2024, SOURCE: IEEE Solid-State Circuits Magazine, VOLUME: 16, ISSUE: 1
3
TITLE: A Standard-Cell-Based Neuro-Inspired Integrate-and-Fire Analog-to-Time Converter for Biological and Low-Frequency Signals - Comparison With Analog Version Full Text
AUTHORS: Teixeira, Miguel Lima; Oliveira, Joao P.; Principe, Jose C.; Goes, Joao;
PUBLISHED: 2024, SOURCE: IEEE TRANSACTIONS ON BIOMEDICAL CIRCUITS AND SYSTEMS, VOLUME: 18, ISSUE: 4
AUTHORS: Teixeira, Miguel Lima; Oliveira, Joao P.; Principe, Jose C.; Goes, Joao;
PUBLISHED: 2024, SOURCE: IEEE TRANSACTIONS ON BIOMEDICAL CIRCUITS AND SYSTEMS, VOLUME: 18, ISSUE: 4
INDEXED IN: WOS 
CrossRef
WOS CrossRef4
TITLE: Comparative analysis of MIG brazing modes: process stability, bead morphology, microstructure, and mechanical properties Full Text
AUTHORS: Singh, Jaivindra; Arora, Kanwer Singh; Oliveira, Joao P.; Asati, Brajesh;
PUBLISHED: 2024, SOURCE: INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY
AUTHORS: Singh, Jaivindra; Arora, Kanwer Singh; Oliveira, Joao P.; Asati, Brajesh;
PUBLISHED: 2024, SOURCE: INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY
INDEXED IN: Scopus WOS
Scopus WOS5
TITLE: Retraction and Verbal Disputes
AUTHORS: Pedro Abreu; Marcin Lewiński;
PUBLISHED: 2024, SOURCE: Synthese Library, VOLUME: 488
AUTHORS: Pedro Abreu; Marcin Lewiński;
PUBLISHED: 2024, SOURCE: Synthese Library, VOLUME: 488
INDEXED IN: Scopus
Scopus6
TITLE: Impact and compensation of carrier synchronization errors in OFDM signals with very large QAM constellations
AUTHORS: Mokhtari, Zahra; Dinis, Rui; Oliveira, Luis; Oliveira, Joao;
PUBLISHED: 2023, SOURCE: IET COMMUNICATIONS, VOLUME: 17, ISSUE: 9
AUTHORS: Mokhtari, Zahra; Dinis, Rui; Oliveira, Luis; Oliveira, Joao;
PUBLISHED: 2023, SOURCE: IET COMMUNICATIONS, VOLUME: 17, ISSUE: 9
7
TITLE: A Skew-Insensitive Switched Source-Follower Analog Frontend for Time-Interleaved ADCs
AUTHORS: Leonardo, David; Xavier, Joao; Oliveira, Joao; Goes, Joao;
PUBLISHED: 2023, SOURCE: 18th International Conference on Ph.D Research in Microelectronics and Electronics (PRIME) in 2023 18TH CONFERENCE ON PH.D RESEARCH IN MICROELECTRONICS AND ELECTRONICS, PRIME
AUTHORS: Leonardo, David; Xavier, Joao; Oliveira, Joao; Goes, Joao;
PUBLISHED: 2023, SOURCE: 18th International Conference on Ph.D Research in Microelectronics and Electronics (PRIME) in 2023 18TH CONFERENCE ON PH.D RESEARCH IN MICROELECTRONICS AND ELECTRONICS, PRIME
8
TITLE: Introduction: Metalinguistic Disagreement and Semantic Externalism Full Text
AUTHORS: Abreu, Pedro; Terzian, Giulia;
PUBLISHED: 2023, SOURCE: TOPOI-AN INTERNATIONAL REVIEW OF PHILOSOPHY
AUTHORS: Abreu, Pedro; Terzian, Giulia;
PUBLISHED: 2023, SOURCE: TOPOI-AN INTERNATIONAL REVIEW OF PHILOSOPHY
INDEXED IN: Scopus WOS
Scopus WOS9
TITLE: Design of an RF-CMOS Switched-Capacitor Power Amplifier for NB-IoT RF Transceivers
AUTHORS: Ana Isabel Santos; Joao Pedro Oliveira;
PUBLISHED: 2023, SOURCE: 2023 International Young Engineers Forum in Electrical and Computer Engineering, YEF-ECE 2023 in Proceedings - 2023 International Young Engineers Forum in Electrical and Computer Engineering, YEF-ECE 2023
AUTHORS: Ana Isabel Santos; Joao Pedro Oliveira;
PUBLISHED: 2023, SOURCE: 2023 International Young Engineers Forum in Electrical and Computer Engineering, YEF-ECE 2023 in Proceedings - 2023 International Young Engineers Forum in Electrical and Computer Engineering, YEF-ECE 2023
10
TITLE: Assessment of the Zero Distortion Bias Point Using Design-Oriented 7-Parameter MOSFET Model
AUTHORS: Rodrigo Pinto; Pedro Toledo; Joao Oliveira;
PUBLISHED: 2023, SOURCE: 2023 International Young Engineers Forum in Electrical and Computer Engineering, YEF-ECE 2023 in Proceedings - 2023 International Young Engineers Forum in Electrical and Computer Engineering, YEF-ECE 2023
AUTHORS: Rodrigo Pinto; Pedro Toledo; Joao Oliveira;
PUBLISHED: 2023, SOURCE: 2023 International Young Engineers Forum in Electrical and Computer Engineering, YEF-ECE 2023 in Proceedings - 2023 International Young Engineers Forum in Electrical and Computer Engineering, YEF-ECE 2023
