José Miguel Costa Dias Pereira
AuthID: R-000-8RJ
211
TITLE: Fitting transducer characteristics to measured data Full Text
AUTHORS: Dias Pereira, JM; Silva Girao, PMB; Postolache, O ;
PUBLISHED: 2001, SOURCE: IEEE Instrumentation and Measurement Magazine, VOLUME: 4, ISSUE: 4
AUTHORS: Dias Pereira, JM; Silva Girao, PMB; Postolache, O ;
PUBLISHED: 2001, SOURCE: IEEE Instrumentation and Measurement Magazine, VOLUME: 4, ISSUE: 4
212
TITLE: Neural network application in a carbon monoxide measurement system
AUTHORS: Postolache, O ; Girao, P; Pereira, M;
PUBLISHED: 2001, SOURCE: International Joint Conference on Neural Networks (IJCNN'01) in Proceedings of the International Joint Conference on Neural Networks, VOLUME: 3
AUTHORS: Postolache, O ; Girao, P; Pereira, M;
PUBLISHED: 2001, SOURCE: International Joint Conference on Neural Networks (IJCNN'01) in Proceedings of the International Joint Conference on Neural Networks, VOLUME: 3
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ORCID213
TITLE: Neural networks in automated measurement systems: State of the art and new research trends
AUTHORS: Postolache, O ; Girao, P; Pereira, M;
PUBLISHED: 2001, SOURCE: International Joint Conference on Neural Networks (IJCNN'01) in Proceedings of the International Joint Conference on Neural Networks, VOLUME: 3
AUTHORS: Postolache, O ; Girao, P; Pereira, M;
PUBLISHED: 2001, SOURCE: International Joint Conference on Neural Networks (IJCNN'01) in Proceedings of the International Joint Conference on Neural Networks, VOLUME: 3
INDEXED IN: Scopus
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ORCID214
TITLE: Extending digital input/output capabilities to low-cost and NON-linear a/d conversion
AUTHORS: Dias Pereira, JM; Postolache, O; Cruz Serra, A; Silva Girão, P;
PUBLISHED: 2001, SOURCE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
AUTHORS: Dias Pereira, JM; Postolache, O; Cruz Serra, A; Silva Girão, P;
PUBLISHED: 2001, SOURCE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
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ORCID215
TITLE: Microcontroller - based data processing for non-linear measuring sensors
AUTHORS: Postolache, O; Silva Girão, P; Dias Pereira, JM; Fosalau, C;
PUBLISHED: 2001, SOURCE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
AUTHORS: Postolache, O; Silva Girão, P; Dias Pereira, JM; Fosalau, C;
PUBLISHED: 2001, SOURCE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
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ORCID216
TITLE: Laser based smart displacement sensor
AUTHORS: Postolache O.; Pereira M.; Girão P.;
PUBLISHED: 2001, SOURCE: SIcon 2001 - Proceedings of the 1st ISA/IEEE Sensors for Industry Conference
AUTHORS: Postolache O.; Pereira M.; Girão P.;
PUBLISHED: 2001, SOURCE: SIcon 2001 - Proceedings of the 1st ISA/IEEE Sensors for Industry Conference
217
TITLE: Minimizing temperature drift errors of conditioning circuits using artificial neural networks
AUTHORS: Pereira, JMD; Postolache, O ; Girao, PMBS; Cretu, M;
PUBLISHED: 2000, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 49, ISSUE: 5
AUTHORS: Pereira, JMD; Postolache, O ; Girao, PMBS; Cretu, M;
PUBLISHED: 2000, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 49, ISSUE: 5
218
TITLE: Automated characterization of a bifurcated optical fiber bundle displacement sensor taking into account reflector tilting perturbation effects Full Text
AUTHORS: Faria, JB ; Postolache, O ; Pereira, JD; Girao, PS ;
PUBLISHED: 2000, SOURCE: MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, VOLUME: 26, ISSUE: 4
AUTHORS: Faria, JB ; Postolache, O ; Pereira, JD; Girao, PS ;
PUBLISHED: 2000, SOURCE: MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, VOLUME: 26, ISSUE: 4
219
TITLE: Automated characterization of a bifurcated optical fiber bundle displacement sensor taking into account reflector tilting perturbation effects
AUTHORS: Brandão Faria, J; Octavian Postolache; Dias Pereira, J; Silva Girão, P;
PUBLISHED: 2000, SOURCE: Microwave and Optical Technology Letters, VOLUME: 26, ISSUE: 4
AUTHORS: Brandão Faria, J; Octavian Postolache; Dias Pereira, J; Silva Girão, P;
PUBLISHED: 2000, SOURCE: Microwave and Optical Technology Letters, VOLUME: 26, ISSUE: 4
220
TITLE: Dithered ADC systems in the presence of hysteresis errors Full Text
AUTHORS: Pereira, JMD; Serra, AC ; Girao, PS;
PUBLISHED: 1999, SOURCE: 16th IEEE Instrumentation and Measurement Technology Conference in IMTC/99: PROCEEDINGS OF THE 16TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS. 1-3, VOLUME: 3
AUTHORS: Pereira, JMD; Serra, AC ; Girao, PS;
PUBLISHED: 1999, SOURCE: 16th IEEE Instrumentation and Measurement Technology Conference in IMTC/99: PROCEEDINGS OF THE 16TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS. 1-3, VOLUME: 3
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