Metford - Mutation Testing Framework For Android

AuthID
 P-018-AB6
7
Author(s)
Vincenzi, AMR
·
Kuroishi, PH
·
Bispo, JCM
·
da Veiga, ARC
·
da Mata, DRC
·
Azevedo, FB
·
Document Type
Article
Year published
2025
Published
in J. Syst. Softw.
Volume: 222, Pages: 112332
Indexing
Dblp®/en/publications/view/1321318
Publication Identifiers
Dblp: journals/jss/VincenziKBVMAP25
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