Real Time Fault Injection Using Enhanced Ocd - A Performance Analysis

AuthID
P-004-R6J
3
Author(s)
Ferreira, JM
1
Editor(s)
Werner,B
Document Type
Proceedings Paper
Year published
2006
Published
in 21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, Proceedings in DFT, ISSN: 1550-5774
Pages: 254-262 (9)
Conference
21St Ieee International Symposium on Defect and Fault-Tolerance in Vlsi Systems, Date: OCT 04-06, 2006, Location: Arlington, VA, Sponsors: IEEE
Indexing
Publication Identifiers
DBLP: conf/dft/FidalgoAF06
SCOPUS: 2-s2.0-38749111829
Wos: WOS:000242580800027
Source Identifiers
ISSN: 1550-5774
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