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Real Time Fault Injection Using Enhanced Ocd - A Performance Analysis
AuthID
P-004-R6J
3
Author(s)
Fidalgo, AV
·
Alves, GR
·
Ferreira, JM
1
Editor(s)
Werner,B
Document Type
Proceedings Paper
Year published
2006
Published
in
21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, Proceedings
in
DFT,
ISSN: 1550-5774
Pages: 254-262 (9)
Conference
21St Ieee International Symposium on Defect and Fault-Tolerance in Vlsi Systems,
Date:
OCT 04-06, 2006,
Location:
Arlington, VA,
Sponsors:
IEEE
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/en/publications/view/155858
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Publication Identifiers
DOI
:
10.1109/dft.2006.51
DBLP
: conf/dft/FidalgoAF06
Handle
:
https://hdl.handle.net/10400.22/4299
SCOPUS
: 2-s2.0-38749111829
Wos
: WOS:000242580800027
Source Identifiers
ISSN
: 1550-5774
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