Fault Diagnosis Based on Black-Box Models with Application to a Liquid-Level System

AuthID
 P-000-JKD
3
Author(s)
Document Type
Proceedings Paper
Year published
2003
Published
in ETFA 2003: IEEE CONFERENCE ON EMERGING TECHNOLOGIES AND FACTORY AUTOMATION, VOL 2, PROCEEDINGS in ETFA (2), ISSN: 1946-0740
Volume: 2, Issue: January, Pages: 739-746 (8)
Conference
9Th Ieee International Conference on Emerging Technologies and Factory Automation, Date: SEP 16-19, 2003, Location: Lisbon, PORTUGAL, Sponsors: IEEE Ind Elect Soc, UNINOVA, Univ Nova Lisboa FCT DEE, Host: Calouste Gulbenkian Fdn
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Dblp®/en/publications/view/19053
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Publication Identifiers
DBLP: conf/etfa/PalmaCN03
SCOPUS: 2-s2.0-38149069208
Wos: WOS:000189414100111
Source Identifiers
ISSN: 1946-0740
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