Architecture of Test Support Ics for Mixed-Signal Testing

AuthID
 P-007-6DK
4
Author(s)
Matos Jose, S
·
Leao Ana, C
·
1
Editor(s)
Anon
Document Type
Proceedings Paper
Year published
1994
Published
in Proceedings of the IEEE VLSI Test Symposium
Pages: 240-246
Conference
Proceedings of the 12Th Ieee Vlsi Test Symposium, Date: 25 April 1994 through 28 April 1994, Location: Cherry Hill, NJ, USA, Sponsors: IEEE Computer Society;IEEE Philadelphia Section
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-0028734870
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