A Pull-In Based Test Mechanism for Device Diagnostic and Process Characterization

AuthID
 P-007-M4M
5
Author(s)
Mol, L
·
Document Type
Article
Year published
2008
Published
in VLSI Design, ISSN: 1065-514X
Volume: 2008, Pages: 1-7
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Publication Identifiers
SCOPUS: 2-s2.0-43949104695
Source Identifiers
ISSN: 1065-514X
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