Toggle navigation
Publications
Researchers
Institutions
0
Sign In
Federated Authentication
(Click on the image)
Local Sign In
Password Recovery
Register
Sign In
Publications
Search
Statistics
A Pull-In Based Test Mechanism for Device Diagnostic and Process Characterization
AuthID
P-007-M4M
5
Author(s)
Rocha, LA
·
Mol, L
·
Cretu, E
·
Wolffenbuttel, RF
·
MacHado Da Silva, J
Document Type
Article
Year published
2008
Published
in
VLSI Design,
ISSN: 1065-514X
Volume: 2008, Pages: 1-7
Indexing
Scopus
®
Crossref
®
10
Google Scholar
®
Metadata
Sources
Publication Identifiers
DOI
:
10.1155/2008/283451
Scopus
: 2-s2.0-43949104695
Source Identifiers
ISSN
: 1065-514X
Export Publication Metadata
Export
×
Publication Export Settings
BibTex
EndNote
APA
Export Preview
Marked List
Add to Marked List
Info
At this moment we don't have any links to full text documens.
×
Select Source
This publication has:
2 records from
ISI
2 records from
SCOPUS
2 records from
DBLP
2 records from
Unpaywall
2 records from
Openlibrary
2 records from
Handle
Please select which records must be used by Authenticus!
×
Preview Publications
© 2024 CRACS & Inesc TEC - All Rights Reserved
Privacy Policy
|
Terms of Service