Built-In Clock Domain Crossing (Cdc) Test and Diagnosis in Gals Systems

AuthID
 P-007-TZE
8
Author(s)
Silva, JC
·
Lousa, P
·
Document Type
Proceedings Paper
Year published
2010
Published
in Proceedings of the 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2010
Pages: 72-77
Conference
13Th Ieee International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Ddecs 2010, Date: 14 April 2010 through 16 April 2010, Location: Vienna, Sponsors: IEEE Computer Society;Test Technology Technical Council;RUAG Space GmbH;City of Vienna
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Publication Identifiers
SCOPUS: 2-s2.0-77954938189
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