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João Paulo Cacho Teixeira
AuthID:
R-000-7A4
Publications
Confirmed
To Validate
Document Source:
All
Document Type:
All Document Types
Proceedings Paper (64)
Article (40)
Editorial Material (2)
Review (2)
Article in Press (2)
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Order:
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Cit. WOS Dsc
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Cit. Scopus Dsc
IF Scopus Dsc
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Results:
10
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Confirmed Publications: 110
1
TITLE:
Control and data acquisition ATCA/AXIe board designed for high system availability and reliability of nuclear fusion experiments
Full Text
AUTHORS:
Batista, AJN
; Leong, C;
Bexiga, V
;
Rodrigues, AP
;
Combo, A
;
Carvalho, BB
; Carvalho, PF;
Fortunato, J
;
Santos, B
;
Carvalho, P
;
Correia, M
;
Teixeira, JP
;
Teixeira, IC
;
Sousa, J
;
Goncalves, B
;
Varandas, CAF
;
PUBLISHED:
2013
,
SOURCE:
27th Symposium on Fusion Technology (SOFT)
in
FUSION ENGINEERING AND DESIGN,
VOLUME:
88,
ISSUE:
6-8
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
2
TITLE:
Design and Validation of Configurable Online Aging Sensors in Nanometer-Scale FPGAs
AUTHORS:
Maria D Valdes Pena;
Judit F Fernandez Freijedo
; Maria J M Moure Rodriguez; Juan J Rodriguez Andina;
Jorge Semião
;
Isabel Maria C Cacho Teixeira
;
Joao Paulo C Cacho Teixeira
;
Fabian Vargas
;
PUBLISHED:
2013
,
SOURCE:
IEEE TRANSACTIONS ON NANOTECHNOLOGY,
VOLUME:
12,
ISSUE:
4
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
3
TITLE:
Process Variations-Aware Statistical Analysis Framework for Aging Sensors Insertion
Full Text
AUTHORS:
Vazquez, JC; Champac, V;
Jorge Semião
;
Teixeira, IC
;
Santos, MB
;
Teixeira, JP
;
PUBLISHED:
2013
,
SOURCE:
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS,
VOLUME:
29,
ISSUE:
3
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
4
TITLE:
Aging-Aware Power or Frequency Tuning With Predictive Fault Detection
Full Text
AUTHORS:
Jackson Pachito
;
Celestino V Martins
; Bruno Jacinto;
Isabel C Teixeira
;
Joao Paulo Teixeira
;
Jorge Semião
; Julio C Vazquez; Victor Champac;
Marcelino B Santos
;
PUBLISHED:
2012
,
SOURCE:
IEEE DESIGN & TEST OF COMPUTERS,
VOLUME:
29,
ISSUE:
5
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
5
TITLE:
ATCA/AXIe compatible board for fast control and data acquisition in nuclear fusion experiments
Full Text
AUTHORS:
Batista, AJN
; Leong, C;
Bexiga, V
;
Rodrigues, AP
;
Combo, A
;
Carvalho, BB
;
Fortunato, J
;
Correia, M
;
Teixeira, JP
;
Teixeira, IC
;
Sousa, J
;
Goncalves, B
;
Varandas, CAF
;
PUBLISHED:
2012
,
SOURCE:
8th IAEA Technical Meeting on Control, Data Acquisition, and Remote Participation for Fusion Research
in
FUSION ENGINEERING AND DESIGN,
VOLUME:
87,
ISSUE:
12
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
6
TITLE:
Implementation of an ATCA/AXIe Board for Fast Control and Data Acquisition Systems of Nuclear Fusion Devices
AUTHORS:
Antonio J N Batista
;
Carlos Leong
;
Vasco Bexiga
;
Antonio P Rodrigues
;
Alvaro Combo
;
Bernardo B Carvalho
; Paulo F Carvalho;
Joao Fortunato
;
Bruno Santos
;
Pedro Carvalho
;
Miguel Correia
;
Joao P Teixeira
;
Isabel C Teixeira
;
Jorge Sousa
;
Bruno Goncalves
;
Carlos A F Varandas
;
PUBLISHED:
2012
,
SOURCE:
18th IEEE-NPSS Real Time Conference (RT)
in
2012 18TH IEEE-NPSS REAL TIME CONFERENCE (RT)
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
7
TITLE:
ITER prototype fast plant system controller based on ATCA platform
AUTHORS:
Goncalves, B
;
Sousa, J
;
Carvalho, BB
;
Batista, A
;
Neto, A
;
Santos, B
;
Duarte, A
; Valcarcel, D; Alves, D;
Correia, M
;
Rodrigues, AP
; Carvalho, PF;
Fortunato, J
;
Carvalho, PJ
; Ruiz, M; Vega, J; Castro, R; Lopez, JM; Utzel, N; Makijarvi, P;
Leong, C;
Bexiga, V
;
Teixeira, IC
;
Teixeira, JP
;
Barbalace, A;
Lousa, P;
Godinho, J;
Mota, P;
...More
PUBLISHED:
2012
,
SOURCE:
2011 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2011
in
IEEE Nuclear Science Symposium Conference Record
INDEXED IN:
Scopus
8
TITLE:
Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits
Full Text
AUTHORS:
Judit F Freijedo
;
Jorge Semião
; Juan J Rodriguez Andina;
Fabian Vargas
;
Isabel C Teixeira
;
Paulo Teixeira, JP
;
PUBLISHED:
2012
,
SOURCE:
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS,
VOLUME:
28,
ISSUE:
4
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
9
TITLE:
The Influence of Clock-Gating On NBTI-Induced Delay Degradation
AUTHORS:
Pachito, J; Martins, CV;
Jorge Semião
;
Santos, M
;
Teixeira, IC
;
Teixeira, JP
;
PUBLISHED:
2012
,
SOURCE:
IEEE 18th International On-Line Testing Symposium (IOLTS)
in
2012 IEEE 18TH INTERNATIONAL ON-LINE TESTING SYMPOSIUM (IOLTS)
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
10
TITLE:
Adaptive Error-Prediction Flip-flop for Performance Failure Prediction with Aging Sensors
AUTHORS:
Martins, CV;
Jorge Semião
; Vazquez, JC;
Champac, V
;
Santos, M
;
Teixeira, IC
;
Teixeira, JP
;
PUBLISHED:
2011
,
SOURCE:
29th IEEE VLSI Test Symposium (VTS)/Workshop on Design for Reliability and Variability (DRV)
in
2011 IEEE 29TH VLSI TEST SYMPOSIUM (VTS)
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
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