Pattern Based Gui Testing Modeling Environment

AuthID
 P-008-DM8
2
Author(s)
Monteiro, T
·
Document Type
Proceedings Paper
Year published
2013
Published
in IEEE SIXTH INTERNATIONAL CONFERENCE ON SOFTWARE TESTING, VERIFICATION AND VALIDATION WORKSHOPS (ICSTW 2013) in IEEE International Conference on Software Testing Verification and Validation Workshops, ISSN: 2159-4848
Pages: 140-143 (4)
Conference
6Th Ieee International Conference on Software Testing, Verification and Validation (Icst), Date: MAR 18-22, 2013, Location: Luxembourg, LUXEMBOURG, Sponsors: IEEE, P&T Luxembourg, IEE, SES, Fonds Natl Rech Luxembourg, Luxinnovation, Secur & Trust, Univ Luxembourg, Comp Sci & Commun Res Unit, Lab Adv Software Syst, IEEE Comp Soc
Indexing
Wos®
Scopus®
Dblp®/en/publications/view/276104
Crossref®12
Google Scholar®
Publication Identifiers
DBLP: conf/icst/MonteiroP13
SCOPUS: 2-s2.0-84883377743
Wos: WOS:000332185600025
Source Identifiers
ISSN: 2159-4848
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service