Automated Fault Diagnosis in Embedded Systems

AuthID
P-008-PDC
5
Author(s)
Zoeteweij, P
·
Pietersma, J
·
Feldman, A
·
Van Gemund, AJC
Document Type
Proceedings Paper
Year published
2008
Published
in Proceedings - The 2nd IEEE International Conference on Secure System Integration and Reliability Improvement, SSIRI 2008 in SSIRI
Pages: 103-110
Conference
2Nd Ieee International Conference on Secure System Integration and Reliability Improvement, Ssiri 2008, Date: 14 July 2008 through 17 July 2008, Location: Yokohama, Sponsors: IEEE Reliability Society;IEEE Systems, Man, and Cybernetics Society
Indexing
Publication Identifiers
DBLP: conf/ssiri/ZoeteweijPAFG08
SCOPUS: 2-s2.0-51749101919
Export Publication Metadata
Marked List
Info
At this moment we don't have any links to full text documens.