Ic Defects-Based Testability Analysis

AuthID
 P-008-VBT
3
Author(s)
Sousa, JJT
·
Document Type
Proceedings Paper
Year published
1992
Published
in Digest of Papers - International Test Conference, ISSN: 0743-1686
Pages: 500-509
Conference
Proceedings of the International Test Conference 1991, Date: 26 October 1991 through 30 October 1991, Location: Nashville, TN, USA, Sponsors: IEEE Computer Soc;IEEE Philadelphia Section
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-0026677401
Source Identifiers
ISSN: 0743-1686
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