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Lattice Location of Implanted Cu in Highly Doped Si
AuthID
P-000-YR4
6
Author(s)
Wahl, U
·
Vantomme, A
·
Langouche, G
·
Araujo, JP
·
Peralta, L
·
Correia, JG
Document Type
Article
Year published
2000
Published
in
APPLIED PHYSICS LETTERS,
ISSN: 0003-6951
Volume: 77, Issue: 14, Pages: 2142-2144 (3)
Indexing
Wos
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Scopus
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Crossref
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Publication Identifiers
DOI
:
10.1063/1.1314876
Scopus
: 2-s2.0-0001455653
Wos
: WOS:000089524900021
Source Identifiers
ISSN
: 0003-6951
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