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Temperature Dependence and Annealing Effects on Spin Dependent Tunnel Junctions
AuthID
P-001-4KS
7
Author(s)
Sousa, RC
·
Sun, JJ
·
Soares, V
·
Freitas, PP
·
Kling, A
·
da Silva, MF
·
Soares, JC
Document Type
Article
Year published
1999
Published
in
JOURNAL OF APPLIED PHYSICS,
ISSN: 0021-8979
Volume: 85, Issue: 8, Pages: 5258-5260 (3)
Conference
43Rd Annual Conference on Magnetism and Magnetic Materials,
Date:
NOV 09-12, 1998,
Location:
MIAMI, FL,
Sponsors:
Amer Inst Phys, IEEE Magnet Soc, Minerals Met Mat Soc, Amer Soc Testing & Mat, Amer Ceramic Soc, Amer Phys Soc, EMTEC Magnet GmbH, Fuji Photo Film Co Ltd, IBM, Imation, Sony corp, TDK Corp, Toda Kogyo Corp, ADE Technol Inc, digital Measurement Syst Div, Komag, MMC Technol Inc
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Metadata
Sources
Publication Identifiers
DOI
:
10.1063/1.369959
SCOPUS
: 2-s2.0-0032620482
Wos
: WOS:000079850700322
Source Identifiers
ISSN
: 0021-8979
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