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From Design-For-Test to Design-For-Debug-And-Test: Analysis of Requirements and Limitations for 1149.1

AuthID
P-001-6CY

Author(s)

Alves, GR

Ferreira, JMM

Document Type

Proceedings Paper

Year published

1999

Published

in 17TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS in IEEE VLSI TEST SYMPOSIUM, ISSN: 1093-0167

Pages: 473-480 (4)

Conference

17Th Ieee Very Large Scale Intergration Test Symposium, Date: APR 25-29, 1999, Location: DANA POINT, CA, Sponsors: IEEE, Comp Soc, Tech Comm Test Technol

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Metadata
Sources

Publication Identifiers

DOI: 10.1109/VTEST.1999.766706

DBLP: conf/vts/AlvesF99

SCOPUS: 2-s2.0-0032644937

Wos: WOS:000081779300064

Source Identifiers

ISSN: 1093-0167

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