Publications

Realistic Fault Extraction for High-Quality Design and Test of Vlsi Systems

AuthID
P-001-D3Y

Author(s)

Goncalves, FM

Teixeira, IC

Teixeira, JP

Editor(s)

Anon

Document Type

Proceedings Paper

Year published

1997

Published

in 1997 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS, ISSN: 1063-6722

Pages: 29-37 (9)

Conference

1997 Ieee International Symposium on Defect and Fault Tolerance in Vlsi Systems, Date: OCT 20-22, 1997, Location: PARIS, FRANCE, Sponsors: IEEE Comp Soc, IEEE Comp Soc Tech Comm Fault Tolerant Comp, Soc Electriciens & Electroniciens

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Metadata
Sources

Publication Identifiers

DOI: 10.1109/dftvs.1997.628306

SCOPUS: 2-s2.0-0031340342

Wos: WOS:A1997BJ79U00004

Source Identifiers

ISSN: 1063-6722

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