The Effects of Dielectric Loss and Tip Resistance on Resonator Q of the Scanning Evanescent Microwave Microscopy (Semm) Probe

AuthID
 P-00F-VK8
3
Author(s)
Kimber, DP
·
Alford, NM
Document Type
Article
Year published
2008
Published
in Measurement Science and Technology, ISSN: 0957-0233
Volume: 19, Issue: 11, Pages: 115502
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Publication Identifiers
Scopus: 2-s2.0-58149308624
Source Identifiers
ISSN: 0957-0233
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