Back Annotation Of Physical Defects Into Gate-Level, Realistic Faults In Digital Ics

AuthID
 P-001-KTM
5
Author(s)
CALHA, M
·
GONCALVES, F
·
TEIXEIRA, I
·
TEIXEIRA, JP
Document Type
Proceedings Paper
Year published
1994
Published
in INTERNATIONAL TEST CONFERENCE 1994, PROCEEDINGS
Pages: 720-728 (9)
Conference
International Test Conference 1994 (Itc 94) - Test; The Next 25-Years, Date: OCT 02-06, 1994, Location: WASHINGTON, DC, Sponsors: IEEE, COMP SOC, TEST TECHNOL TECH COMM, IEEE, PHILADELPHIA SECT
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Wos®
Publication Identifiers
Wos: WOS:A1994BC12N00092
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