ProfileOfResearchers

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TITLE: Activic: Design-based automatic characterization of mixed-signal integrated circuits
AUTHORS: Moita, TH; Almeida, CB ; Dos Santos, MB ;
PUBLISHED: 2013, SOURCE: Journal of Low Power Electronics, VOLUME: 9, ISSUE: 1

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TITLE: Process Variations-Aware Statistical Analysis Framework for Aging Sensors Insertion Full Text
AUTHORS: Vazquez, JC; Champac, V; Jorge Semião ; Teixeira, IC ; Santos, MB ; Teixeira, JP ;
PUBLISHED: 2013, SOURCE: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 29, ISSUE: 3

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TITLE: Ultra low power capless LDO with dynamic biasing of derivative feedback Full Text
AUTHORS: Jorge Esteves; Joao Pereira; Julio Paisana; Marcelino Santos ;
PUBLISHED: 2013, SOURCE: MICROELECTRONICS JOURNAL, VOLUME: 44, ISSUE: 2

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TITLE: Aging-Aware Power or Frequency Tuning With Predictive Fault Detection Full Text
AUTHORS: Jackson Pachito; Celestino V Martins; Bruno Jacinto; Isabel C Teixeira ; Joao Paulo Teixeira ; Jorge Semião ; Julio C Vazquez; Victor Champac; Marcelino B Santos ;
PUBLISHED: 2012, SOURCE: IEEE DESIGN & TEST OF COMPUTERS, VOLUME: 29, ISSUE: 5

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TITLE: An Ultra-Low Noise Current Source For Magnetoresistive Biosensors Biasing
AUTHORS: Tiago Costa; Moises S Piedade ; Marcelino Santos ;
PUBLISHED: 2012, SOURCE: IEEE Biomedical Circuits and Systems Conference (BioCAS) in 2012 IEEE BIOMEDICAL CIRCUITS AND SYSTEMS CONFERENCE (BIOCAS): INTELLIGENT BIOMEDICAL ELECTRONICS AND SYSTEM FOR BETTER LIFE AND BETTER ENVIRONMENT

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TITLE: Modeling of inherent losses of fully integrated switched capacitor DC-DC converters
AUTHORS: Sadio, V; Rein, F; Munker, C; Santos, M ;
PUBLISHED: 2012, SOURCE: Journal of Low Power Electronics, VOLUME: 8, ISSUE: 5

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TITLE: The Influence of Clock-Gating On NBTI-Induced Delay Degradation
AUTHORS: Pachito, J; Martins, CV; Jorge Semião ; Santos, M ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2012, SOURCE: IEEE 18th International On-Line Testing Symposium (IOLTS) in 2012 IEEE 18TH INTERNATIONAL ON-LINE TESTING SYMPOSIUM (IOLTS)

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TITLE: A low-noise CMOS front-end for TOF-PET
AUTHORS: Rolo, MD ; Alves, LN ; Martins, EV ; Rivetti, A; Santos, MB ; Varela, J ;
PUBLISHED: 2011, SOURCE: JOURNAL OF INSTRUMENTATION, VOLUME: 6, ISSUE: 9

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CrossRef: 6

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TITLE: Adaptive Error-Prediction Flip-flop for Performance Failure Prediction with Aging Sensors
AUTHORS: Martins, CV; Jorge Semião ; Vazquez, JC; Champac, V; Santos, M ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2011, SOURCE: 29th IEEE VLSI Test Symposium (VTS)/Workshop on Design for Reliability and Variability (DRV) in 2011 IEEE 29TH VLSI TEST SYMPOSIUM (VTS)

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