The Critical Feature Dimension and Critical Sampling Problems

AuthID
 P-00G-F9G
4
Author(s)
Suryakumar, Divya
·
Basnet, RamB.
3
Editor(s)
Maria De Marsico; Mário A. T. Figueiredo; Ana L. N. Fred
Document Type
Proceedings Paper
Year published
2015
Published
in ICPRAM 2015 - Proceedings of the International Conference on Pattern Recognition Applications and Methods, Volume 1, Lisbon, Portugal, 10-12 January, 2015. in ICPRAM (1)
Volume: 1, Pages: 360-366
Conference
4Th International Conference on Pattern Recognition Applications and Methods, Icpram 2015, Date: 10 January 2015 through 12 January 2015, Sponsors: Institute for Systems and Technologies of Information, Control and Communication (INSTICC)
Indexing
Scopus®
Dblp®/en/publications/view/539952
Publication Identifiers
Dblp: conf/icpram/RibeiroSSB15
Scopus: 2-s2.0-84938851785
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