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Response Time Analysis of Slotted Widom in Noisy Wireless Channels
AuthID
P-00G-SXZ
4
Author(s)
Vahabi, M
·
Tennina, S
·
Tovar, E
·
Andersson, B
Document Type
Proceedings Paper
Year published
2015
Published
in
PROCEEDINGS OF 2015 IEEE 20TH CONFERENCE ON EMERGING TECHNOLOGIES & FACTORY AUTOMATION (ETFA)
in
IEEE International Conference on Emerging Technologies and Factory Automation-ETFA,
ISSN: 1946-0740
Volume: 2015-October, Pages: 1-9 (9)
Conference
20Th Ieee Conference on Emerging Technologies and Factory Automation (Etfa),
Date:
SEP 08-11, 2015,
Location:
Univ Luxembourg, Interdisciplinary Ctr Secur Reliabil & Trust, LUXEMBOURG,
Sponsors:
IEEE, IEEE Ind Elect Soc,
Host:
Univ Luxembourg, Interdisciplinary Ctr Secur Reliabil & Trust
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Wos
®
Scopus
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Dblp
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/en/publications/view/550847
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Metadata
Sources
Publication Identifiers
DOI
:
10.1109/ETFA.2015.7301468
DBLP
: conf/etfa/VahabiTTA15
Handle
:
https://hdl.handle.net/10400.22/6834
SCOPUS
: 2-s2.0-84952942722
Wos
: WOS:000378564800069
Source Identifiers
ISSN
: 1946-0740
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