Towards a Pattern Language for Model-Based Gui Testing

AuthID
 P-00G-T23
2
Author(s)
2
Editor(s)
Veli-Pekka Eloranta; Uwe van Heesch
Document Type
Proceedings Paper
Year published
2014
Published
in ACM International Conference Proceeding Series in EuroPLoP
Volume: 09-13-July-2014, Pages: 26:1-26:8
Conference
19Th European Conference on Pattern Languages of Programs, Europlop 2014, Date: 9 July 2014 through 13 July 2014
Indexing
Scopus®
Dblp®/en/publications/view/550979
Crossref®3
Google Scholar®
Publication Identifiers
DBLP: conf/europlop/MoreiraP14
SCOPUS: 2-s2.0-84955601006
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