Publications

A Fast Spatial Variation Modeling Algorithm for Efficient Test Cost Reduction of Analog/Rf Circuits

AuthID
P-00G-TQ9

Author(s)

Gonçalves, HugoR.

Butler, KennethM.

Editor(s)

Wolfgang Nebel; David Atienza

Document Type

Proceedings Paper

Year published

2015

Published

in Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015 in DATE, ISSN: 1530-1591

Volume: 2015-April, Pages: 1042-1047

Conference

2015 Design, Automation and Test in Europe Conference and Exhibition, Date 2015, Date: 9 March 2015 through 13 March 2015, Sponsors: ACM Special Interest Group on Design Automation (ACM SiGda);Electronic Design Automation Consortium (EDA);European Design and Automation Association (EDAA);European Electronic Chips and Systems Design Initiative (ECSI);IEEE Council on Electronic Design Automation (CEDA);Russian Academy of Sciences

Indexing